Enhanced thermoelectric power and electronic correlations in RuSe 2

Wang, Kefeng; Wang, Aifeng; Tomic, A.; Wang, Limin; Abeykoon, A. M. Milinda; Dooryhee, E.; Billinge, S. J. L.; Petrovic, C.

doi:10.1063/1.4913919

Title: Enhanced thermoelectric power and electronic correlations in RuSe ₂

Journal Article · Wed Apr 01 00:00:00 EDT 2015 · APL Materials

DOI:https://doi.org/10.1063/1.4913919· OSTI ID:1618876

^[1]; Wang, Aifeng ^[1]; Tomic, A. ^[1]; Wang, Limin ^[1]; Abeykoon, A. M. Milinda ^[2]; Dooryhee, E. ^[2]; Billinge, S. J. L. ^[3]; Petrovic, C. ^[1]

Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, New York 11973, USA
Photon Sciences Directorate, Brookhaven National Laboratory, Upton, New York 11973, USA
Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, New York 11973, USA, Department of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, USA

We report the electronic structure, electric and thermal transport properties of Ru_1-xIr_xSe₂ (x ≤ 0.2). RuSe₂ is a semiconductor that crystallizes in a cubic pyrite unit cell. The Seebeck coefficient of RuSe₂ exceeds -200 _μV/K around 730 K. Ir substitution results in the suppression of the resistivity and the Seebeck coefficient, suggesting the removal of the peaks in density of states near the Fermi level. Ru_0.8Ir_0.2Se₂ shows a semiconductor-metal crossover at about 30 K. The magnetic field restores the semiconducting behavior. Our results indicate the importance of the electronic correlations in enhanced thermoelectricity of RuSb₂.

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Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-98CH10886; SC00112704

OSTI ID:: 1618876

Alternate ID(s):: OSTI ID: 1183257; OSTI ID: 1185051

Report Number(s):: BNL-107667-2015-JA

Journal Information:: APL Materials, Journal Name: APL Materials Vol. 3 Journal Issue: 4; ISSN 2166-532X

Publisher:: American Institute of PhysicsCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 12 works

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