Topographic measurement of buried thin-film interfaces using a grazing resonant soft x-ray scattering technique

Gann, Eliot; Watson, Anne; Tumbleston, John R.; Cochran, Justin; Yan, Hongping; Wang, Cheng; Seok, Jaewook; Chabinyc, Michael; Ade, Harald

doi:10.1103/PhysRevB.90.245421

Title: Topographic measurement of buried thin-film interfaces using a grazing resonant soft x-ray scattering technique

Journal Article · Mon Dec 15 00:00:00 EST 2014 · Physical Review. B, Condensed Matter and Materials Physics

DOI:https://doi.org/10.1103/PhysRevB.90.245421· OSTI ID:1179887

Gann, Eliot; Watson, Anne; Tumbleston, John R.; Cochran, Justin; Yan, Hongping; Wang, Cheng; Seok, Jaewook; Chabinyc, Michael; Ade, Harald

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Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1179887

Journal Information:: Physical Review. B, Condensed Matter and Materials Physics, Journal Name: Physical Review. B, Condensed Matter and Materials Physics Vol. 90 Journal Issue: 24; ISSN 1098-0121

Publisher:: American Physical SocietyCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 14 works

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References (35)

Soft x-ray resonant magneto-optical constants at the Gd $M_{4, 5}$ and Fe $L_{2, 3}$ edges Peters, J. F.; Miguel, J.; de Vries, M. A. Physical Review B, Vol. 70, Issue 22 https://doi.org/10.1103/PhysRevB.70.224417	journal	December 2004
Liquid-crystalline semiconducting polymers with high charge-carrier mobility McCulloch, Iain; Heeney, Martin; Bailey, Clare Nature Materials, Vol. 5, Issue 4 https://doi.org/10.1038/nmat1612	journal	March 2006
Polarized X-ray scattering reveals non-crystalline orientational ordering in organic films Collins, B. A.; Cochran, J. E.; Yan, H. Nature Materials, Vol. 11, Issue 6 https://doi.org/10.1038/nmat3310	journal	April 2012
Real-Time Monitoring of Growing Nanoparticles Renaud, G. Science, Vol. 300, Issue 5624 https://doi.org/10.1126/science.1082146	journal	May 2003
Calibrated NEXAFS spectra of common conjugated polymers Watts, B.; Swaraj, S.; Nordlund, D. The Journal of Chemical Physics, Vol. 134, Issue 2 https://doi.org/10.1063/1.3506636	journal	January 2011
A comparison of the merits of isotopic substitution in neutron small-angle scattering and anomalous X-ray scattering for the evaluation of partial structure functions in a ternary alloy Simon, J. P.; Lyon, O.; de Fontaine, D. Journal of Applied Crystallography, Vol. 18, Issue 4 https://doi.org/10.1107/S0021889885010196	journal	August 1985
Morphology and Optical Properties of P3HT:MEH-CN-PPV Blend Films Ruderer, Matthias A.; Wang, Cheng; Schaible, Eric Macromolecules, Vol. 46, Issue 11 https://doi.org/10.1021/ma4006999	journal	May 2013
Mobility of Polymers at the Air/Polymer Interface Kerle, Tobias; Lin, Zhiqun; Kim, Ho-Cheol Macromolecules, Vol. 34, Issue 10 https://doi.org/10.1021/ma0020335	journal	May 2001
Interfaces in organic devices studied with resonant soft x-ray reflectivity Yan, Hongping; Wang, Cheng; Garcia, Andres Journal of Applied Physics, Vol. 110, Issue 10 https://doi.org/10.1063/1.3661991	journal	November 2011
Resonant soft X-ray reflectivity as a sensitive probe to investigate polished zinc sulphide surface Gupta, Pooja; Sinha, A. K.; Modi, M. H. Applied Surface Science, Vol. 257, Issue 1 https://doi.org/10.1016/j.apsusc.2010.06.066	journal	October 2010
Influence of dielectric-dependent interfacial widths on device performance in top-gate P(NDI2OD-T2) field-effect transistors Yan, Hongping; Schuettfort, Torben; Kronemeijer, Auke J. Applied Physics Letters, Vol. 101, Issue 9 https://doi.org/10.1063/1.4748976	journal	August 2012
Soft x-ray scattering facility at the Advanced Light Source with real-time data processing and analysis Gann, E.; Young, A. T.; Collins, B. A. Review of Scientific Instruments, Vol. 83, Issue 4 https://doi.org/10.1063/1.3701831	journal	April 2012
Probing surface and interface morphology with Grazing Incidence Small Angle X-Ray Scattering Renaud, Gilles; Lazzari, Rémi; Leroy, Frédéric Surface Science Reports, Vol. 64, Issue 8 https://doi.org/10.1016/j.surfrep.2009.07.002	journal	August 2009
NEXAFS microscopy and resonant scattering: Composition and orientation probed in real and reciprocal space Ade, Harald; Hitchcock, Adam P. Polymer, Vol. 49, Issue 3 https://doi.org/10.1016/j.polymer.2007.10.030	journal	February 2008
Cross-sectional imaging of individual layers and buried interfaces of graphene-based heterostructures and superlattices Haigh, S. J.; Gholinia, A.; Jalil, R. Nature Materials, Vol. 11, Issue 9 https://doi.org/10.1038/nmat3386	journal	July 2012
Resonant X-Ray Scattering from Orbital Ordering in ${LaMnO}_{3}$ Murakami, Y.; Hill, J. P.; Gibbs, D. Physical Review Letters, Vol. 81, Issue 3 https://doi.org/10.1103/PhysRevLett.81.582	journal	July 1998
Molecular Characterization of Organic Electronic Films DeLongchamp, Dean M.; Kline, R. Joseph; Fischer, Daniel A. Advanced Materials, Vol. 23, Issue 3 https://doi.org/10.1002/adma.201001760	journal	August 2010
Frequency modulation detection using high‐ Q cantilevers for enhanced force microscope sensitivity Albrecht, T. R.; Grütter, P.; Horne, D. Journal of Applied Physics, Vol. 69, Issue 2 https://doi.org/10.1063/1.347347	journal	January 1991
Superconducting Transition at 38 K in Insulating-Overdoped ${La}_{2} Cu O_{4} − {La}_{1.64} {Sr}_{0.36} Cu O_{4}$ Superlattices: Evidence for Interface Electronic Redistribution from Resonant Soft X-Ray Scattering Smadici, S.; Lee, J. C. T.; Wang, S. Physical Review Letters, Vol. 102, Issue 10 https://doi.org/10.1103/PhysRevLett.102.107004	journal	March 2009
Polymer Photovoltaic Cells: Enhanced Efficiencies via a Network of Internal Donor-Acceptor Heterojunctions Yu, G.; Gao, J.; Hummelen, J. C. Science, Vol. 270, Issue 5243, p. 1789-1791 https://doi.org/10.1126/science.270.5243.1789	journal	December 1995
Trends in anomalous small-angle X-ray scattering in grazing incidence for supported nanoalloyed and core-shell metallic nanoparticles Andreazza, P.; Khelfane, H.; Lyon, O. The European Physical Journal Special Topics, Vol. 208, Issue 1 https://doi.org/10.1140/epjst/e2012-01621-4	journal	June 2012
Microstructure of Polycrystalline PBTTT Films: Domain Mapping and Structure Formation Schuettfort, Torben; Watts, Benjamin; Thomsen, Lars ACS Nano, Vol. 6, Issue 2 https://doi.org/10.1021/nn2051295	journal	January 2012
Resonant soft x-ray scattering from structured polymer nanoparticles Araki, Tohru; Ade, Harald; Stubbs, Jeffrey M. Applied Physics Letters, Vol. 89, Issue 12 https://doi.org/10.1063/1.2356306	journal	September 2006
Polymer solar cells Li, Gang; Zhu, Rui; Yang, Yang Nature Photonics, Vol. 6, Issue 3 https://doi.org/10.1038/nphoton.2012.11	journal	February 2012
P3HT/PCBM Bulk Heterojunction Organic Photovoltaics: Correlating Efficiency and Morphology Chen, Dian; Nakahara, Atsuhiro; Wei, Dongguang Nano Letters, Vol. 11, Issue 2, p. 561-567 https://doi.org/10.1021/nl103482n	journal	February 2011
Waveguide-enhanced grazing-incidence small-angle x-ray scattering of buried nanostructures in thin films Jiang, Zhang; Lee, Dong Ryeol; Narayanan, Suresh Physical Review B, Vol. 84, Issue 7 https://doi.org/10.1103/PhysRevB.84.075440	journal	August 2011
X-ray diffuse scattering as a probe for thin film and interface structure Sinha, S. K. Journal de Physique III, Vol. 4, Issue 9 https://doi.org/10.1051/Jp3:1994221	journal	September 1994
Molecular bond selective x-ray scattering for nanoscale analysis of soft matter Mitchell, G. E.; Landes, B. G.; Lyons, J. Applied Physics Letters, Vol. 89, Issue 4 https://doi.org/10.1063/1.2234301	journal	July 2006
X-Ray Scattering from Soft-Matter Thin Films Tolan, Metin Springer Tracts in Modern Physics https://doi.org/10.1007/BFb0112834	book	January 1999
Structural and Electronic Reconstructions at the LaAlO ₃ /SrTiO ₃ Interface Salluzzo, M.; Gariglio, S.; Torrelles, X. Advanced Materials, Vol. 25, Issue 16 https://doi.org/10.1002/adma.201204555	journal	February 2013
Device Physics of Solution-Processed Organic Field-Effect Transistors Sirringhaus, H. Advanced Materials, Vol. 17, Issue 20, p. 2411-2425 https://doi.org/10.1002/adma.200501152	journal	October 2005
Progress with Light-Emitting Polymers Bernius, M. T.; Inbasekaran, M.; O’Brien, J. Advanced Materials, Vol. 12, Issue 23 https://doi.org/10.1002/1521-4095(200012)12:23%3c1737::AID-ADMA1737%3e3.0.CO;2-N	journal	December 2000
Dewetting of confined polymer films: an X-ray and neutron scattering study Müller-Buschbaum, P.; Gutmann, J. S.; Stamm, M. Physical Chemistry Chemical Physics, Vol. 1, Issue 17 https://doi.org/10.1039/a903012c	journal	January 1999
Resonant elastic soft x-ray scattering in oxygen-ordered YBa $_{2}$ Cu $_{3}$ O $_{6 + δ}$ Hawthorn, D. G.; Shen, K. M.; Geck, J. Physical Review B, Vol. 84, Issue 7 https://doi.org/10.1103/PhysRevB.84.075125	journal	August 2011
Highly oriented crystals at the buried interface in polythiophene thin-film transistors Joseph Kline, R.; McGehee, Michael D.; Toney, Michael F. Nature Materials, Vol. 5, Issue 3 https://doi.org/10.1038/nmat1590	journal	February 2006

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