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Title: Thickness determination of few-layer hexagonal boron nitride films by scanning electron microscopy and Auger electron spectroscopy

Authors:
;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1179631
Grant/Contract Number:  
AC02–98CH10886
Resource Type:
Journal Article: Published Article
Journal Name:
APL Materials
Additional Journal Information:
Journal Name: APL Materials Journal Volume: 2 Journal Issue: 9; Journal ID: ISSN 2166-532X
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Sutter, P., and Sutter, E. Thickness determination of few-layer hexagonal boron nitride films by scanning electron microscopy and Auger electron spectroscopy. United States: N. p., 2014. Web. doi:10.1063/1.4889815.
Sutter, P., & Sutter, E. Thickness determination of few-layer hexagonal boron nitride films by scanning electron microscopy and Auger electron spectroscopy. United States. doi:10.1063/1.4889815.
Sutter, P., and Sutter, E. Mon . "Thickness determination of few-layer hexagonal boron nitride films by scanning electron microscopy and Auger electron spectroscopy". United States. doi:10.1063/1.4889815.
@article{osti_1179631,
title = {Thickness determination of few-layer hexagonal boron nitride films by scanning electron microscopy and Auger electron spectroscopy},
author = {Sutter, P. and Sutter, E.},
abstractNote = {},
doi = {10.1063/1.4889815},
journal = {APL Materials},
number = 9,
volume = 2,
place = {United States},
year = {Mon Sep 01 00:00:00 EDT 2014},
month = {Mon Sep 01 00:00:00 EDT 2014}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at 10.1063/1.4889815

Citation Metrics:
Cited by: 7 works
Citation information provided by
Web of Science

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