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Title: Direct and quantitative broadband absorptance spectroscopy with multilayer cantilever probes

Abstract

A system for measuring the absorption spectrum of a sample is provided that includes a broadband light source that produces broadband light defined within a range of an absorptance spectrum. An interferometer modulates the intensity of the broadband light source for a range of modulation frequencies. A bi-layer cantilever probe arm is thermally connected to a sample arm having at most two layers of materials. The broadband light modulated by the interferometer is directed towards the sample and absorbed by the sample and converted into heat, which causes a temperature rise and bending of the bi-layer cantilever probe arm. A detector mechanism measures and records the deflection of the probe arm so as to obtain the absorptance spectrum of the sample.

Inventors:
; ; ;
Publication Date:
Research Org.:
Massachusetts Institute of Technology, Cambridge, MA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1178245
Patent Number(s):
9,012,849
Application Number:
13/937,713
Assignee:
Massachusetts Institute of Technology (Cambridge, MA) CHO
DOE Contract Number:  
FG02-02ER45977
Resource Type:
Patent
Resource Relation:
Patent File Date: 2013 Jul 09
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Hsu, Wei-Chun, Tong, Jonathan Kien-Kwok, Liao, Bolin, and Chen, Gang. Direct and quantitative broadband absorptance spectroscopy with multilayer cantilever probes. United States: N. p., 2015. Web.
Hsu, Wei-Chun, Tong, Jonathan Kien-Kwok, Liao, Bolin, & Chen, Gang. Direct and quantitative broadband absorptance spectroscopy with multilayer cantilever probes. United States.
Hsu, Wei-Chun, Tong, Jonathan Kien-Kwok, Liao, Bolin, and Chen, Gang. Tue . "Direct and quantitative broadband absorptance spectroscopy with multilayer cantilever probes". United States. https://www.osti.gov/servlets/purl/1178245.
@article{osti_1178245,
title = {Direct and quantitative broadband absorptance spectroscopy with multilayer cantilever probes},
author = {Hsu, Wei-Chun and Tong, Jonathan Kien-Kwok and Liao, Bolin and Chen, Gang},
abstractNote = {A system for measuring the absorption spectrum of a sample is provided that includes a broadband light source that produces broadband light defined within a range of an absorptance spectrum. An interferometer modulates the intensity of the broadband light source for a range of modulation frequencies. A bi-layer cantilever probe arm is thermally connected to a sample arm having at most two layers of materials. The broadband light modulated by the interferometer is directed towards the sample and absorbed by the sample and converted into heat, which causes a temperature rise and bending of the bi-layer cantilever probe arm. A detector mechanism measures and records the deflection of the probe arm so as to obtain the absorptance spectrum of the sample.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Apr 21 00:00:00 EDT 2015},
month = {Tue Apr 21 00:00:00 EDT 2015}
}

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