Auto-calibrated scanning-angle prism-type total internal reflection microscopy for nanometer-precision axial position determination and optional variable-illumination-depth pseudo total internal reflection microscopy

Title: Auto-calibrated scanning-angle prism-type total internal reflection microscopy for nanometer-precision axial position determination and optional variable-illumination-depth pseudo total internal reflection microscopy

Abstract

A method, apparatus, and system for improved VA-TIRFM microscopy. The method comprises automatically controlled calibration of one or more laser sources by precise control of presentation of each laser relative a sample for small incremental changes of incident angle over a range of critical TIR angles. The calibration then allows precise scanning of the sample for any of those calibrated angles for higher and more accurate resolution, and better reconstruction of the scans for super resolution reconstruction of the sample. Optionally the system can be controlled for incident angles of the excitation laser at sub-critical angles for pseudo TIRFM. Optionally both above-critical angle and sub critical angle measurements can be accomplished with the same system.

Inventors:: Fang, Ning; Sun, Wei

Publication Date:: 2015-04-21

Research Org.:: Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1178244

Patent Number(s):: 9,012,872

Application Number:: 13/006,739

Assignee:: Iowa State University Research Foundation, Inc. (Ames, IA)

DOE Contract Number:: AC02-07CH11358

Resource Type:: Patent

Resource Relation:: Patent File Date: 2011 Jan 14

Country of Publication:: United States

Language:: English

Subject:: 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 36 MATERIALS SCIENCE

Citation Formats


                    Fang, Ning, and Sun, Wei. Auto-calibrated scanning-angle prism-type total internal reflection microscopy for nanometer-precision axial position determination and optional variable-illumination-depth pseudo total internal reflection microscopy.  United States: N. p., 2015. 
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                    Fang, Ning, & Sun, Wei. Auto-calibrated scanning-angle prism-type total internal reflection microscopy for nanometer-precision axial position determination and optional variable-illumination-depth pseudo total internal reflection microscopy.  United States.

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                    Fang, Ning, and Sun, Wei. Tue .  
        "Auto-calibrated scanning-angle prism-type total internal reflection microscopy for nanometer-precision axial position determination and optional variable-illumination-depth pseudo total internal reflection microscopy".  United States.  https://www.osti.gov/servlets/purl/1178244.

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@article{osti_1178244,

  title        = {Auto-calibrated scanning-angle prism-type total internal reflection microscopy for nanometer-precision axial position determination and optional variable-illumination-depth pseudo total internal reflection microscopy},

  author       = {Fang, Ning and Sun, Wei},

  abstractNote = {A method, apparatus, and system for improved VA-TIRFM microscopy. The method comprises automatically controlled calibration of one or more laser sources by precise control of presentation of each laser relative a sample for small incremental changes of incident angle over a range of critical TIR angles. The calibration then allows precise scanning of the sample for any of those calibrated angles for higher and more accurate resolution, and better reconstruction of the scans for super resolution reconstruction of the sample. Optionally the system can be controlled for incident angles of the excitation laser at sub-critical angles for pseudo TIRFM. Optionally both above-critical angle and sub critical angle measurements can be accomplished with the same system.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2015},

  month        = {4}

}

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Works referenced in this record:

Autocalibrated Scanning-Angle Prism-Type Total Internal Reflection Fluorescence Microscopy for Nanometer-Precision Axial Position Determination
journal, March 2010

Sun, Wei; Marchuk, Kyle; Wang, Gufeng
Analytical Chemistry, Vol. 82, Issue 6
DOI: 10.1021/ac902789z

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Title: Auto-calibrated scanning-angle prism-type total internal reflection microscopy for nanometer-precision axial position determination and optional variable-illumination-depth pseudo total internal reflection microscopy

Abstract

Citation Formats

Autocalibrated Scanning-Angle Prism-Type Total Internal Reflection Fluorescence Microscopy for Nanometer-Precision Axial Position Determination journal, March 2010

Autocalibrated Scanning-Angle Prism-Type Total Internal Reflection Fluorescence Microscopy for Nanometer-Precision Axial Position Determination
journal, March 2010