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Apparatus and method for determining microscale interactions based on compressive sensors such as crystal structures

Patent ·
OSTI ID:1178238

Techniques for determining values for a metric of microscale interactions include determining a mesoscale metric for a plurality of mesoscale interaction types, wherein a value of the mesoscale metric for each mesoscale interaction type is based on a corresponding function of values of the microscale metric for the plurality of the microscale interaction types. A plurality of observations that indicate the values of the mesoscale metric are determined for the plurality of mesoscale interaction types. Values of the microscale metric are determined for the plurality of microscale interaction types based on the plurality of observations and the corresponding functions and compressed sensing.

Research Organization:
Leland Stanford Jr. Univ., Palo Alto, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
FG02-05ER64136
Assignee:
The Board of Trustees of the Leland Stanford Jr. University (Palo Alto, CA)
Patent Number(s):
9,014,988
Application Number:
13/426,824
OSTI ID:
1178238
Country of Publication:
United States
Language:
English

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