skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: NMR characterization of thin films

Abstract

A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.

Inventors:
; ; ; ;
Publication Date:
Research Org.:
The University Of Chicago, Chicago, IL (United States); Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1176368
Patent Number(s):
7,737,691
Application Number:
12/198,724
Assignee:
The University of Chicago (Chicago, IL) OSTI
DOE Contract Number:  
W-31-109-ENG-38
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

Citation Formats

Gerald II, Rex E., Klingler, Robert J., Rathke, Jerome W., Diaz, Rocio, and Vukovic, Lela. NMR characterization of thin films. United States: N. p., 2010. Web.
Gerald II, Rex E., Klingler, Robert J., Rathke, Jerome W., Diaz, Rocio, & Vukovic, Lela. NMR characterization of thin films. United States.
Gerald II, Rex E., Klingler, Robert J., Rathke, Jerome W., Diaz, Rocio, and Vukovic, Lela. Tue . "NMR characterization of thin films". United States. https://www.osti.gov/servlets/purl/1176368.
@article{osti_1176368,
title = {NMR characterization of thin films},
author = {Gerald II, Rex E. and Klingler, Robert J. and Rathke, Jerome W. and Diaz, Rocio and Vukovic, Lela},
abstractNote = {A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jun 15 00:00:00 EDT 2010},
month = {Tue Jun 15 00:00:00 EDT 2010}
}

Patent:

Save / Share: