NMR characterization of thin films

Gerald II, Rex E.; Klingler, Robert J.; Rathke, Jerome W.; Diaz, Rocio; Vukovic, Lela

Title: NMR characterization of thin films

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Abstract

A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.

Inventors:: Gerald II, Rex E.; Klingler, Robert J.; Rathke, Jerome W.; Diaz, Rocio; Vukovic, Lela

Publication Date:: 2010-06-15

Research Org.:: Argonne National Laboratory (ANL), Argonne, IL (United States); Univ. of Chicago, IL (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1176368

Patent Number(s):: 7,737,691

Application Number:: 12/198,724

Assignee:: The University of Chicago (Chicago, IL)

DOE Contract Number:: W-31-109-ENG-38

Resource Type:: Patent

Resource Relation:: Patent File Date: 2008 Aug 26

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE; 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

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                    Gerald II, Rex E., Klingler, Robert J., Rathke, Jerome W., Diaz, Rocio, and Vukovic, Lela. NMR characterization of thin films.  United States: N. p., 2010. 
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                    Gerald II, Rex E., Klingler, Robert J., Rathke, Jerome W., Diaz, Rocio, & Vukovic, Lela. NMR characterization of thin films.  United States.

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                    Gerald II, Rex E., Klingler, Robert J., Rathke, Jerome W., Diaz, Rocio, and Vukovic, Lela. 2010.  
        "NMR characterization of thin films".  United States.  https://www.osti.gov/servlets/purl/1176368.

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@article{osti_1176368,

  title        = {NMR characterization of thin films},

  author       = {Gerald II, Rex E. and Klingler, Robert J. and Rathke, Jerome W. and Diaz, Rocio and Vukovic, Lela},

  abstractNote = {A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.},

  doi          = {},

  url          = {https://www.osti.gov/biblio/1176368},
  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2010},

  month        = {6}

}

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