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Title: Electron microscope phase enhancement

Abstract

A microfabricated electron phase shift element is used for modifying the phase characteristics of an electron beam passing though its center aperture, while not affecting the more divergent portion of an incident beam to selectively provide a ninety-degree phase shift to the unscattered beam in the back focal plan of the objective lens, in order to realize Zernike-type, in-focus phase contrast in an electron microscope. One application of the element is to increase the contrast of an electron microscope for viewing weakly scattering samples while in focus. Typical weakly scattering samples include biological samples such as macromolecules, or perhaps cells. Preliminary experimental images demonstrate that these devices do apply a ninety degree phase shift as expected. Electrostatic calculations have been used to determine that fringing fields in the region of the scattered electron beams will cause a negligible phase shift as long as the ratio of electrode length to the transverse feature-size aperture is about 5:1. Calculations are underway to determine the feasibility of aspect smaller aspect ratios of about 3:1 and about 2:1.

Inventors:
;
Publication Date:
Research Org.:
The Regents of the University of California, Oakland, CA (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1176366
Patent Number(s):
7,737,412
Application Number:
11/571,980
Assignee:
The Regents of the University of California (Oakland, CA) OSTI
DOE Contract Number:  
AC02-05CH11231
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 59 BASIC BIOLOGICAL SCIENCES

Citation Formats

Jin, Jian, and Glaeser, Robert M. Electron microscope phase enhancement. United States: N. p., 2010. Web.
Jin, Jian, & Glaeser, Robert M. Electron microscope phase enhancement. United States.
Jin, Jian, and Glaeser, Robert M. Tue . "Electron microscope phase enhancement". United States. https://www.osti.gov/servlets/purl/1176366.
@article{osti_1176366,
title = {Electron microscope phase enhancement},
author = {Jin, Jian and Glaeser, Robert M.},
abstractNote = {A microfabricated electron phase shift element is used for modifying the phase characteristics of an electron beam passing though its center aperture, while not affecting the more divergent portion of an incident beam to selectively provide a ninety-degree phase shift to the unscattered beam in the back focal plan of the objective lens, in order to realize Zernike-type, in-focus phase contrast in an electron microscope. One application of the element is to increase the contrast of an electron microscope for viewing weakly scattering samples while in focus. Typical weakly scattering samples include biological samples such as macromolecules, or perhaps cells. Preliminary experimental images demonstrate that these devices do apply a ninety degree phase shift as expected. Electrostatic calculations have been used to determine that fringing fields in the region of the scattered electron beams will cause a negligible phase shift as long as the ratio of electrode length to the transverse feature-size aperture is about 5:1. Calculations are underway to determine the feasibility of aspect smaller aspect ratios of about 3:1 and about 2:1.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jun 15 00:00:00 EDT 2010},
month = {Tue Jun 15 00:00:00 EDT 2010}
}

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