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Title: Method and apparatus for measuring birefringent particles

Abstract

A method and apparatus for measuring birefringent particles is provided comprising a source lamp, a grating, a first polarizer having a first transmission axis, a sample cell and a second polarizer having a second polarization axis. The second polarizer has a second polarization axis that is set to be perpendicular to the first polarization axis, and thereby blocks linearly polarized light with the orientation of the beam of light passing through the first polarizer. The beam of light passing through the second polarizer is measured using a detector.

Inventors:
;
Publication Date:
Research Org.:
The Regents of the University of California, Oakland, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1175711
Patent Number(s):
7,030,981
Application Number:
10/215,518
Assignee:
The Regents of the University of California (Oakland, CA) OSTI
DOE Contract Number:
AC03-76SF000-98
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Bishop, James K., and Guay, Christopher K. Method and apparatus for measuring birefringent particles. United States: N. p., 2006. Web.
Bishop, James K., & Guay, Christopher K. Method and apparatus for measuring birefringent particles. United States.
Bishop, James K., and Guay, Christopher K. Tue . "Method and apparatus for measuring birefringent particles". United States. doi:. https://www.osti.gov/servlets/purl/1175711.
@article{osti_1175711,
title = {Method and apparatus for measuring birefringent particles},
author = {Bishop, James K. and Guay, Christopher K.},
abstractNote = {A method and apparatus for measuring birefringent particles is provided comprising a source lamp, a grating, a first polarizer having a first transmission axis, a sample cell and a second polarizer having a second polarization axis. The second polarizer has a second polarization axis that is set to be perpendicular to the first polarization axis, and thereby blocks linearly polarized light with the orientation of the beam of light passing through the first polarizer. The beam of light passing through the second polarizer is measured using a detector.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Apr 18 00:00:00 EDT 2006},
month = {Tue Apr 18 00:00:00 EDT 2006}
}

Patent:

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