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Title: Micro-tensile testing system

Abstract

A micro-tensile testing system providing a stand-alone test platform for testing and reporting physical or engineering properties of test samples of materials having thicknesses of approximately between 0.002 inch and 0.030 inch, including, for example, LiGA engineered materials. The testing system is able to perform a variety of static, dynamic, and cyclic tests. The testing system includes a rigid frame and adjustable gripping supports to minimize measurement errors due to deflection or bending under load; serrated grips for securing the extremely small test sample; high-speed laser scan micrometers for obtaining accurate results; and test software for controlling the testing procedure and reporting results.

Inventors:
Publication Date:
Research Org.:
Kansas City Plant (KCP), Kansas City, MO (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1175610
Patent Number(s):
6,983,658
Application Number:
10/412,508
Assignee:
Honeywell Federal Manufacturing & Technologies, LLC (Kansas City, MD) OSTI
DOE Contract Number:
AC04-01AL66850
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Wenski, Edward G. Micro-tensile testing system. United States: N. p., 2006. Web.
Wenski, Edward G. Micro-tensile testing system. United States.
Wenski, Edward G. Tue . "Micro-tensile testing system". United States. doi:. https://www.osti.gov/servlets/purl/1175610.
@article{osti_1175610,
title = {Micro-tensile testing system},
author = {Wenski, Edward G.},
abstractNote = {A micro-tensile testing system providing a stand-alone test platform for testing and reporting physical or engineering properties of test samples of materials having thicknesses of approximately between 0.002 inch and 0.030 inch, including, for example, LiGA engineered materials. The testing system is able to perform a variety of static, dynamic, and cyclic tests. The testing system includes a rigid frame and adjustable gripping supports to minimize measurement errors due to deflection or bending under load; serrated grips for securing the extremely small test sample; high-speed laser scan micrometers for obtaining accurate results; and test software for controlling the testing procedure and reporting results.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jan 10 00:00:00 EST 2006},
month = {Tue Jan 10 00:00:00 EST 2006}
}

Patent:

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