Domain epitaxy for thin film growth
Patent
·
OSTI ID:1175528
A method of forming an epitaxial film on a substrate includes growing an initial layer of a film on a substrate at a temperature T.sub.growth, said initial layer having a thickness h and annealing the initial layer of the film at a temperature T.sub.anneal, thereby relaxing the initial layer, wherein said thickness h of the initial layer of the film is greater than a critical thickness h.sub.c. The method further includes growing additional layers of the epitaxial film on the initial layer subsequent to annealing. In some embodiments, the method further includes growing a layer of the film that includes at least one amorphous island.
- Research Organization:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC05-00OR22725;
- Assignee:
- Kopin Corporation (Taunton, MA)
- Patent Number(s):
- 6,955,985
- Application Number:
- 10/608,780
- OSTI ID:
- 1175528
- Country of Publication:
- United States
- Language:
- English
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