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Title: High resistivity aluminum antimonide radiation detector

Patent ·
OSTI ID:1175339

Bulk Aluminum Antimonide (AlSb)-based single crystal materials have been prepared for use as ambient (room) temperature X-ray and Gamma-ray radiation detection.

Research Organization:
Univ. of California, Oakland, CA (United States); Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
W-7405-ENG-48
Assignee:
The Regents of the University of California (Oakland, CA)
Patent Number(s):
6,887,441
Application Number:
10/260,141
OSTI ID:
1175339
Country of Publication:
United States
Language:
English

References (9)

Annealing and bulk crystal growth of undoped InP under controlled P-pressure: a perspective for the preparation of undoped SI InP? conference January 1991
Growth and characterization of doped and undoped AlSb single crystals journal August 1990
Preparation of Single‐Phase Crystals of Compounds with Extremely Small Existence Regions journal December 1965
Tantalum doping and high resistivity in aluminium antimonide journal May 1963
On the growth of AlSb single crystals journal April 1989
Semi-insulating InP through wafer annealing conference January 1997
Free carrier lifetime in high resistivity aluminium antimonide journal May 1967
Brief communication. Reduction of dislocation density by thermal annealing of (100) gallium antimonide substrates journal August 1993
ALSB as a High-Energy Photon Detector journal June 1977

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