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Title: Quantitation of absorbed or deposited materials on a substrate that measures energy deposition

Patent ·
OSTI ID:1175207

This invention provides a system and method for measuring an energy differential that correlates to quantitative measurement of an amount mass of an applied localized material. Such a system and method remains compatible with other methods of analysis, such as, for example, quantitating the elemental or isotopic content, identifying the material, or using the material in biochemical analysis.

Research Organization:
The Regents of the Univ. of California, Oakland, CA (United States); Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
W-7405-ENG-48
Assignee:
The Regents of the University of California (Oakland, CA)
Patent Number(s):
6,844,543
Application Number:
10/434,590
OSTI ID:
1175207
Country of Publication:
United States
Language:
English

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