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Title: Universal EUV in-band intensity detector

Patent ·
OSTI ID:1174995

Extreme ultraviolet light is detected using a universal in-band detector for detecting extreme ultraviolet radiation that includes: (a) an EUV sensitive photodiode having a diode active area that generates a current responsive to EUV radiation; (b) one or more mirrors that reflects EUV radiation having a defined wavelength(s) to the diode active area; and (c) a mask defining a pinhole that is positioned above the diode active area, wherein EUV radiation passing through the pinhole is restricted substantially to illuminating the diode active area.

Research Organization:
Sandia National Lab. (SNL-CA), Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
Assignee:
EUV, LLC (Santa Clara, CA)
Patent Number(s):
6,781,135
Application Number:
10/301,080
OSTI ID:
1174995
Country of Publication:
United States
Language:
English

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