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Title: Technique to quantitatively measure magnetic properties of thin structures at <10 NM spatial resolution

Patent ·
OSTI ID:1174393

A highly sensitive and high resolution magnetic microscope images magnetic properties quantitatively. Imaging is done with a modified transmission electron microscope that allows imaging of the sample in a zero magnetic field. Two images from closely spaced planes, one in focus and one slightly out of focus, are sufficient to calculate the absolute values of the phase change imparted to the electrons, and hence obtain the magnetization vector field distribution.

Research Organization:
Univ. of California, Oakland, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
W-7405-ENG-48
Assignee:
The Regents of the University of California (Oakland, CA)
Patent Number(s):
6,590,209
Application Number:
09/516,878
OSTI ID:
1174393
Country of Publication:
United States
Language:
English

References (5)

Noninterferometric Phase Imaging with Partially Coherent Light journal March 1998
Improved high resolution image processing of bright field electron micrographs journal January 1984
Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy journal December 1992
Practical Image Restoration of Thick Biological Specimens Using Multiple Focus Levels in Transmission Electron Microscopy journal December 1997
Quantitative phase-sensitive imaging in a transmission electron microscope journal May 2000

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75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY