Technique to quantitatively measure magnetic properties of thin structures at <10 NM spatial resolution
Patent
·
OSTI ID:1174393
A highly sensitive and high resolution magnetic microscope images magnetic properties quantitatively. Imaging is done with a modified transmission electron microscope that allows imaging of the sample in a zero magnetic field. Two images from closely spaced planes, one in focus and one slightly out of focus, are sufficient to calculate the absolute values of the phase change imparted to the electrons, and hence obtain the magnetization vector field distribution.
- Research Organization:
- The Regents of the University of California, Oakland, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- W-7405-ENG-48
- Assignee:
- The Regents of the University of California (Oakland, CA)
- Patent Number(s):
- 6,590,209
- Application Number:
- 09/516,878
- OSTI ID:
- 1174393
- Country of Publication:
- United States
- Language:
- English
Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy
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journal | December 1992 |
Quantitative phase-sensitive imaging in a transmission electron microscope
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journal | May 2000 |
Noninterferometric Phase Imaging with Partially Coherent Light
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journal | March 1998 |
Improved high resolution image processing of bright field electron micrographs
|
journal | January 1984 |
Practical Image Restoration of Thick Biological Specimens Using Multiple Focus Levels in Transmission Electron Microscopy
|
journal | December 1997 |
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