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Room temperature aluminum antimonide radiation detector and methods thereof

Patent ·
OSTI ID:1171651
In one embodiment, a method for producing a high-purity single crystal of aluminum antimonide (AlSb) includes providing a growing environment with which to grow a crystal, growing a single crystal of AlSb in the growing environment which comprises hydrogen (H.sub.2) gas to reduce oxide formation and subsequent incorporation of oxygen impurities in the crystal, and adding a controlled amount of at least one impurity to the growing environment to effectively incorporate at least one dopant into the crystal. In another embodiment, a high energy radiation detector includes a single high-purity crystal of AlSb, a supporting structure for the crystal, and logic for interpreting signals obtained from the crystal which is operable as a radiation detector at a temperature of about 25.degree. C. In one embodiment, a high-purity single crystal of AlSb includes AlSb and at least one dopant selected from a group consisting of selenium (Se), tellurium (Te), and tin (Sn).
Research Organization:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC52-07NA27344
Assignee:
Lawrence Livermore National Security, LLC (Livermore, CA)
Patent Number(s):
8,969,803
Application Number:
12/774,388
OSTI ID:
1171651
Country of Publication:
United States
Language:
English

References (8)

Wet thermal oxidation of AlAsSb alloys lattice matched to InP journal June 1997
ALSB as a High-Energy Photon Detector journal June 1977
A Rutherford Backscattering Spectroscopic Study of the Aluminum Antimonide Oxidation Process in Air journal April 1994
Wet thermal oxidation of AlAsSb lattice matched to InP for optoelectronic applications journal May 1996
Wet oxidation of AlAsSb alloys catalyzed by methanol journal July 2000
Suppression of AlSb oxidation with hydrocarbon passivation layer induced by MeV‐He + irradiation journal August 1994
Extrinsic point defects in aluminum antimonide journal May 2010
Charge carrier scattering by defects in semiconductors journal June 2010

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