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Title: Reflection High-Energy Electron Diffraction Beam-Induced Structural and Property Changes on WO3 Thin Films

Abstract

Reduction of transition metal oxides can greatly change their physical and chemical properties. Using deposition of WO3 as a case study, we demonstrate that reflection high-energy electron diffraction (RHEED), a surface-sensitive tool widely used to monitor thin-film deposition processes, can significantly affect the cation valence and physical properties of the films through electron-beam induced sample reduction. The RHEED beam is found to increase film smoothness during epitaxial growth of WO3, as well as change the electronic properties of the film through preferential removal of surface oxygen.

Authors:
; ; ;
Publication Date:
Research Org.:
Pacific Northwest National Laboratory (PNNL), Richland, WA (US), Environmental Molecular Sciences Laboratory (EMSL)
Sponsoring Org.:
USDOE
OSTI Identifier:
1170457
Report Number(s):
PNNL-SA-103911
47621; 47862; KP1704020
DOE Contract Number:  
AC05-76RL01830
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters, 105(5):051606
Country of Publication:
United States
Language:
English
Subject:
Environmental Molecular Sciences Laboratory

Citation Formats

Du, Yingge, Zhang, Hongliang, Varga, Tamas, and Chambers, Scott A. Reflection High-Energy Electron Diffraction Beam-Induced Structural and Property Changes on WO3 Thin Films. United States: N. p., 2014. Web. doi:10.1063/1.4892810.
Du, Yingge, Zhang, Hongliang, Varga, Tamas, & Chambers, Scott A. Reflection High-Energy Electron Diffraction Beam-Induced Structural and Property Changes on WO3 Thin Films. United States. doi:10.1063/1.4892810.
Du, Yingge, Zhang, Hongliang, Varga, Tamas, and Chambers, Scott A. Fri . "Reflection High-Energy Electron Diffraction Beam-Induced Structural and Property Changes on WO3 Thin Films". United States. doi:10.1063/1.4892810.
@article{osti_1170457,
title = {Reflection High-Energy Electron Diffraction Beam-Induced Structural and Property Changes on WO3 Thin Films},
author = {Du, Yingge and Zhang, Hongliang and Varga, Tamas and Chambers, Scott A.},
abstractNote = {Reduction of transition metal oxides can greatly change their physical and chemical properties. Using deposition of WO3 as a case study, we demonstrate that reflection high-energy electron diffraction (RHEED), a surface-sensitive tool widely used to monitor thin-film deposition processes, can significantly affect the cation valence and physical properties of the films through electron-beam induced sample reduction. The RHEED beam is found to increase film smoothness during epitaxial growth of WO3, as well as change the electronic properties of the film through preferential removal of surface oxygen.},
doi = {10.1063/1.4892810},
journal = {Applied Physics Letters, 105(5):051606},
number = ,
volume = ,
place = {United States},
year = {Fri Aug 08 00:00:00 EDT 2014},
month = {Fri Aug 08 00:00:00 EDT 2014}
}