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Title: Nanomechanical testing system

Abstract

An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.

Inventors:
; ; ; ; ; ;
Publication Date:
Research Org.:
Hysitron, Inc., Eden Prairie, MN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1168726
Patent Number(s):
8,939,041
Application Number:
13/984,250
Assignee:
Hysitron, Inc. (Eden Prairie, MN) DOESC
DOE Contract Number:  
SC0002722
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY

Citation Formats

Vodnick, David James, Dwivedi, Arpit, Keranen, Lucas Paul, Okerlund, Michael David, Schmitz, Roger William, Warren, Oden Lee, and Young, Christopher David. Nanomechanical testing system. United States: N. p., 2015. Web.
Vodnick, David James, Dwivedi, Arpit, Keranen, Lucas Paul, Okerlund, Michael David, Schmitz, Roger William, Warren, Oden Lee, & Young, Christopher David. Nanomechanical testing system. United States.
Vodnick, David James, Dwivedi, Arpit, Keranen, Lucas Paul, Okerlund, Michael David, Schmitz, Roger William, Warren, Oden Lee, and Young, Christopher David. Tue . "Nanomechanical testing system". United States. doi:. https://www.osti.gov/servlets/purl/1168726.
@article{osti_1168726,
title = {Nanomechanical testing system},
author = {Vodnick, David James and Dwivedi, Arpit and Keranen, Lucas Paul and Okerlund, Michael David and Schmitz, Roger William and Warren, Oden Lee and Young, Christopher David},
abstractNote = {An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jan 27 00:00:00 EST 2015},
month = {Tue Jan 27 00:00:00 EST 2015}
}

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Works referenced in this record:

Ultra-microhardness of vacuum-deposited films I: Ultra-microhardness tester
journal, February 1978