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Title: Systems and methods for sample analysis

Abstract

The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.

Inventors:
; ; ;
Publication Date:
Research Org.:
Purdue Research Foundation, West Lafayette, IN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1167213
Patent Number(s):
8,932,875
Application Number:
13/977,758
Assignee:
Purdue Research Foundation (West Lafayette, IN) CHO
DOE Contract Number:
FG02-06ER15807
Resource Type:
Patent
Resource Relation:
Patent File Date: 2011 Dec 29
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING

Citation Formats

Cooks, Robert Graham, Li, Guangtao, Li, Xin, and Ouyang, Zheng. Systems and methods for sample analysis. United States: N. p., 2015. Web.
Cooks, Robert Graham, Li, Guangtao, Li, Xin, & Ouyang, Zheng. Systems and methods for sample analysis. United States.
Cooks, Robert Graham, Li, Guangtao, Li, Xin, and Ouyang, Zheng. Tue . "Systems and methods for sample analysis". United States. doi:. https://www.osti.gov/servlets/purl/1167213.
@article{osti_1167213,
title = {Systems and methods for sample analysis},
author = {Cooks, Robert Graham and Li, Guangtao and Li, Xin and Ouyang, Zheng},
abstractNote = {The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jan 13 00:00:00 EST 2015},
month = {Tue Jan 13 00:00:00 EST 2015}
}

Patent:

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