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Title: Helical antiferromagnetic ordering in Lu1-xScxMnSi

Journal Article · · Physical Review. B, Condensed Matter and Materials Physics

Polycrystalline samples of Lu1-xScxMnSi (x=0, 0.25, 0.5) are studied using powder x-ray diffraction, heat capacity Cp, magnetization, magnetic susceptibility χ, and electrical resistivity ρ measurements versus temperature T and magnetic field H. This system crystallizes in the primitive orthorhombic TiNiSi-type structure (space group Pnma) as previously reported. The ρ(T) data indicate metallic behavior. The Cp(T), χ(T), and ρ(T) measurements consistently indicate long-range antiferromagnetic (AF) transitions with AF ordering temperatures TN=246, 215, and 188 K for x=0, 0.25, and 0.5, respectively. A second transition is observed at somewhat lower T for each sample from the χ(T) and ρ(T) measurements, which we speculate are due to spin reorientation transitions; these second transitions are completely suppressed in H=5.5 T. The Cp data below 10 K for each composition indicate an enhanced Sommerfeld electronic heat capacity coefficient for the series in the range γ=24–29 mJ/mol K2. The χ(T) measurements up to 1000 K were fitted by local-moment Curie-Weiss behaviors which indicate a low Mn spin S~1. The χ data below TN are analyzed using the Weiss molecular field theory for a planar noncollinear cycloidal AF structure with a composition-dependent pitch, following the previous neutron diffraction work of Venturini et al. [J. Alloys Compd. 256, 65 (1997)]. Within this model, the fits indicate a turn angle between Mn ordered moments along the cycloid axis of ~100° or ~145°, either of which indicate dominant AF interactions between the Mn spins in the Lu1-xScxMnSi series of compounds.

Research Organization:
Ames Lab., Ames, IA (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
DOE Contract Number:
DE-AC02-07CH11358
OSTI ID:
1166782
Report Number(s):
IS-J 8467; PRBMDO; ArticleNumber: 064415
Journal Information:
Physical Review. B, Condensed Matter and Materials Physics, Vol. 90, Issue 6; ISSN 1098-0121
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English

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