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Title: Method of collecting and processing electron diffraction data

Abstract

A method of using electron diffraction to obtain PDFs from crystalline, nanocrystalline, and amorphous inorganic, organic, and organometallic compound.

Inventors:
; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1166756
Patent Number(s):
8,921,783
Application Number:
14/160,185
Assignee:
The Trustees of Columbia University in the City of New York (New York, NY) CHO
DOE Contract Number:  
AC02-98CH10886
Resource Type:
Patent
Resource Relation:
Patent File Date: 2014 Jan 21
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; 47 OTHER INSTRUMENTATION

Citation Formats

Billinge, Simon, Farrow, Christopher, Gorelik, Tatiana E, Kanatzidis, Mercouri, and Schmidt, Martin U. Method of collecting and processing electron diffraction data. United States: N. p., 2014. Web.
Billinge, Simon, Farrow, Christopher, Gorelik, Tatiana E, Kanatzidis, Mercouri, & Schmidt, Martin U. Method of collecting and processing electron diffraction data. United States.
Billinge, Simon, Farrow, Christopher, Gorelik, Tatiana E, Kanatzidis, Mercouri, and Schmidt, Martin U. Tue . "Method of collecting and processing electron diffraction data". United States. doi:. https://www.osti.gov/servlets/purl/1166756.
@article{osti_1166756,
title = {Method of collecting and processing electron diffraction data},
author = {Billinge, Simon and Farrow, Christopher and Gorelik, Tatiana E and Kanatzidis, Mercouri and Schmidt, Martin U},
abstractNote = {A method of using electron diffraction to obtain PDFs from crystalline, nanocrystalline, and amorphous inorganic, organic, and organometallic compound.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Dec 30 00:00:00 EST 2014},
month = {Tue Dec 30 00:00:00 EST 2014}
}

Patent:

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