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Title: Thickness Determination of Few-Layer Hexagonal Boron Nitride Films by Scanning Electron Microscopy and Auger Electron Spectroscopy

Authors:
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1165693
Report Number(s):
BNL-107102-2014-JA
R&D Project: 16080/16080; KC0403020
DOE Contract Number:  
DE-AC02-98CH10886
Resource Type:
Journal Article
Resource Relation:
Journal Name: APL Materials; Journal Volume: 2
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Sutter P. Thickness Determination of Few-Layer Hexagonal Boron Nitride Films by Scanning Electron Microscopy and Auger Electron Spectroscopy. United States: N. p., 2014. Web. doi:10.1063/1.4889815.
Sutter P. Thickness Determination of Few-Layer Hexagonal Boron Nitride Films by Scanning Electron Microscopy and Auger Electron Spectroscopy. United States. doi:10.1063/1.4889815.
Sutter P. Wed . "Thickness Determination of Few-Layer Hexagonal Boron Nitride Films by Scanning Electron Microscopy and Auger Electron Spectroscopy". United States. doi:10.1063/1.4889815.
@article{osti_1165693,
title = {Thickness Determination of Few-Layer Hexagonal Boron Nitride Films by Scanning Electron Microscopy and Auger Electron Spectroscopy},
author = {Sutter P.},
abstractNote = {},
doi = {10.1063/1.4889815},
journal = {APL Materials},
number = ,
volume = 2,
place = {United States},
year = {Wed Jul 16 00:00:00 EDT 2014},
month = {Wed Jul 16 00:00:00 EDT 2014}
}