Reliability of Commercially Available and State of the Art SiC MOSFETs Under Gate Stress and Body Diode Stress
Technical Report
·
OSTI ID:1164638
- Research Organization:
- Arkansas Power Electronics International, Inc.
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- SC0011315
- OSTI ID:
- 1164638
- Type / Phase:
- SBIR
- Report Number(s):
- DOE-APEI-11315
- Country of Publication:
- United States
- Language:
- English
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