Operation and performance of the ATLAS semiconductor tracker

Aad, G.; Abbott, B.; Abdallah, J.; Khalek, S. Abdel; Abdinov, O.; Aben, R.; Abi, B.; Abolins, M.; AbouZeid, O. S.; Abramowicz, H.; Abreu, H.; Abreu, R.; Abulaitia, Y.; Acharya, B. S.; Adamczyk, L.; Adams, D. L.; Adelman, J.; Adomeit, S.; Adye, T.

doi:10.1088/1748-0221/9/08/P08009

Title: Operation and performance of the ATLAS semiconductor tracker

Journal Article · Fri Aug 01 00:00:00 EDT 2014 · JOURNAL OF INSTRUMENTATION

DOI:https://doi.org/10.1088/1748-0221/9/08/P08009· OSTI ID:1163076

Aad, G.; Abbott, B.; Abdallah, J.; Khalek, S. Abdel; Abdinov, O.; Aben, R.; Abi, B.; Abolins, M.; AbouZeid, O. S.; Abramowicz, H.; Abreu, H.; Abreu, R.; Abulaitia, Y.; Acharya, B. S.; Adamczyk, L.; Adams, D. L.; Adelman, J.; Adomeit, S.; Adye, T.

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Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE SC OFFICE OF SCIENCE (SC)

DOE Contract Number:: DE-AC02-98CH10886

OSTI ID:: 1163076

Report Number(s):: BNL-107031-2014-JA; KA1101021

Journal Information:: JOURNAL OF INSTRUMENTATION, Journal Name: JOURNAL OF INSTRUMENTATION

Country of Publication:: United States

Language:: English

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Cited By (2)

In situ radiation damage studies of optoelectronics in the ATLAS SemiConductor Tracker Dawson, I.; Gallop, B.; Liu, J. Journal of Instrumentation, Vol. 14, Issue 07 https://doi.org/10.1088/1748-0221/14/07/p07014	journal	July 2019
In situ radiation damage studies of optoelectronics in the ATLAS SemiConductor Tracker Dawson, I.; Gallop, B.; Liu, J. Deutsches Elektronen-Synchrotron, DESY, Hamburg https://doi.org/10.3204/pubdb-2020-00282	text	January 2019

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