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Title: NEXAFS/XPS Spectra, and Information Depth Using Low Energy Electron Spectromicroscopy in a VPPEM

Authors:
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL)
Sponsoring Org.:
USDOE SC OFFICE OF SCIENCE (SC)
OSTI Identifier:
1162761
Report Number(s):
BNL-106707-2014-JA
Journal ID: ISSN 0368-2048
DOE Contract Number:
DE-AC02-98CH10886
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Electron Spectroscopy and Related Phenomena; Journal Volume: 195
Country of Publication:
United States
Language:
English

Citation Formats

Browning, R. NEXAFS/XPS Spectra, and Information Depth Using Low Energy Electron Spectromicroscopy in a VPPEM. United States: N. p., 2014. Web. doi:10.1016/j.elspec.2014.06.005.
Browning, R. NEXAFS/XPS Spectra, and Information Depth Using Low Energy Electron Spectromicroscopy in a VPPEM. United States. doi:10.1016/j.elspec.2014.06.005.
Browning, R. Fri . "NEXAFS/XPS Spectra, and Information Depth Using Low Energy Electron Spectromicroscopy in a VPPEM". United States. doi:10.1016/j.elspec.2014.06.005.
@article{osti_1162761,
title = {NEXAFS/XPS Spectra, and Information Depth Using Low Energy Electron Spectromicroscopy in a VPPEM},
author = {Browning, R.},
abstractNote = {},
doi = {10.1016/j.elspec.2014.06.005},
journal = {Journal of Electron Spectroscopy and Related Phenomena},
number = ,
volume = 195,
place = {United States},
year = {Fri Aug 01 00:00:00 EDT 2014},
month = {Fri Aug 01 00:00:00 EDT 2014}
}