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Title: Apparatus and procedure to characterize the surface quality of conductors by measuring the rate of cathode emission as a function of surface electric field strength

Abstract

A device and method for characterizing quality of a conducting surface. The device including a gaseous ionizing chamber having centrally located inside the chamber a conducting sample to be tested to which a negative potential is applied, a plurality of anode or "sense" wires spaced regularly about the central test wire, a plurality of "field wires" at a negative potential are spaced regularly around the sense, and a plurality of "guard wires" at a positive potential are spaced regularly around the field wires in the chamber. The method utilizing the device to measure emission currents from the conductor.

Inventors:
; ;
Publication Date:
Research Org.:
Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1160281
Patent Number(s):
8,863,568
Application Number:
13/374,752
Assignee:
Jefferson Science Associates, LLC (Newport News, VA)
DOE Contract Number:  
AC05-06OR23177
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
25 ENERGY STORAGE

Citation Formats

Mestayer, Mac, Christo, Steve, and Taylor, Mark. Apparatus and procedure to characterize the surface quality of conductors by measuring the rate of cathode emission as a function of surface electric field strength. United States: N. p., 2014. Web.
Mestayer, Mac, Christo, Steve, & Taylor, Mark. Apparatus and procedure to characterize the surface quality of conductors by measuring the rate of cathode emission as a function of surface electric field strength. United States.
Mestayer, Mac, Christo, Steve, and Taylor, Mark. 2014. "Apparatus and procedure to characterize the surface quality of conductors by measuring the rate of cathode emission as a function of surface electric field strength". United States. https://www.osti.gov/servlets/purl/1160281.
@article{osti_1160281,
title = {Apparatus and procedure to characterize the surface quality of conductors by measuring the rate of cathode emission as a function of surface electric field strength},
author = {Mestayer, Mac and Christo, Steve and Taylor, Mark},
abstractNote = {A device and method for characterizing quality of a conducting surface. The device including a gaseous ionizing chamber having centrally located inside the chamber a conducting sample to be tested to which a negative potential is applied, a plurality of anode or "sense" wires spaced regularly about the central test wire, a plurality of "field wires" at a negative potential are spaced regularly around the sense, and a plurality of "guard wires" at a positive potential are spaced regularly around the field wires in the chamber. The method utilizing the device to measure emission currents from the conductor.},
doi = {},
url = {https://www.osti.gov/biblio/1160281}, journal = {},
number = ,
volume = ,
place = {United States},
year = {2014},
month = {10}
}