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Title: Multi-step contrast sensitivity gauge

Abstract

An X-ray contrast sensitivity gauge is described herein. The contrast sensitivity gauge comprises a plurality of steps of varying thicknesses. Each step in the gauge includes a plurality of recesses of differing depths, wherein the depths are a function of the thickness of their respective step. An X-ray image of the gauge is analyzed to determine a contrast-to-noise ratio of a detector employed to generate the image.

Inventors:
; ; ; ; ; ; ;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1159975
Patent Number(s):
8,858,076
Application Number:
13/241,569
Assignee:
Sandia Corporation (Albuquerque, NM) SNL-A
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Patent
Resource Relation:
Patent File Date: 2011 Sep 23
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Quintana, Enrico C, Thompson, Kyle R, Moore, David G, Heister, Jack D, Poland, Richard W, Ellegood, John P, Hodges, George K, and Prindville, James E. Multi-step contrast sensitivity gauge. United States: N. p., 2014. Web.
Quintana, Enrico C, Thompson, Kyle R, Moore, David G, Heister, Jack D, Poland, Richard W, Ellegood, John P, Hodges, George K, & Prindville, James E. Multi-step contrast sensitivity gauge. United States.
Quintana, Enrico C, Thompson, Kyle R, Moore, David G, Heister, Jack D, Poland, Richard W, Ellegood, John P, Hodges, George K, and Prindville, James E. Tue . "Multi-step contrast sensitivity gauge". United States. https://www.osti.gov/servlets/purl/1159975.
@article{osti_1159975,
title = {Multi-step contrast sensitivity gauge},
author = {Quintana, Enrico C and Thompson, Kyle R and Moore, David G and Heister, Jack D and Poland, Richard W and Ellegood, John P and Hodges, George K and Prindville, James E},
abstractNote = {An X-ray contrast sensitivity gauge is described herein. The contrast sensitivity gauge comprises a plurality of steps of varying thicknesses. Each step in the gauge includes a plurality of recesses of differing depths, wherein the depths are a function of the thickness of their respective step. An X-ray image of the gauge is analyzed to determine a contrast-to-noise ratio of a detector employed to generate the image.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2014},
month = {10}
}

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