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Title: Interplane resistivity of underdoped single crystals (Ba1-xKx)Fe2As2(0<= x < 0.34)

Journal Article · · Physical Review. B, Condensed Matter and Materials Physics

The temperature-dependent interplane resistivity ρc(T) was measured in the hole-doped iron arsenide superconductor (Ba1-xKx)Fe2As2 over a doping range from parent compound to optimal doping at Tc≈38 K, 0≤x≤0.34. The measurements were undertaken on high-quality single crystals grown from FeAs flux. The coupled magnetic/structural transition at TSM leads to a clear accelerated decrease of ρc(T) on cooling in samples with Tc<26 K (x<0.25). This decrease in the hole-doped material is in notable contrast to the increase in ρc(T) in the electron-doped Ba(Fe1-xCox)Fe 2As2 and isoelectron-substituted BaFe2(As1-xPx)2. TSM decreases very sharply with doping, dropping from Ts=71 K to zero on increase of Tc from approximately 25 to 27 K. ρc(T) becomes linear in T close to optimal doping. The broad crossover maximum in ρc(T), found in the parent BaFe2As2 at around Tmax~200 K, shifts to higher temperature ~250 K with doping of x=0.34. The maximum shows clear correlation with the broad crossover feature found in the temperature-dependent in-plane resistivity ρa(T). The evolution with doping of Tmax in (Ba1-xKx)Fe2As2 is in notable contrast with both the rapid suppression of Tmax found in Ba(Fe1-xTx)2As2 (T=Co,Rh,Ni,Pd) and its rapid increase in BaFe2(As1-xPx)2. This observation suggests that pseudogap features are much stronger in hole-doped than in electron-doped iron-based superconductors, revealing significant electron-hole doping asymmetry similar to that in the cuprates.

Research Organization:
Ames Lab., Ames, IA (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
DOE Contract Number:
DE-AC02-07CH11358
OSTI ID:
1157649
Report Number(s):
IS-J 8362; PRBMDO; ArticleNumber: 144514
Journal Information:
Physical Review. B, Condensed Matter and Materials Physics, Vol. 89, Issue 14; ISSN 1098-0121
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English

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