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Title: Self-terminating Diffraction Gates Femtosecond X-ray Nanocrystallography Measurements

Authors:
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Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1157046
Report Number(s):
SLAC-REPRINT-2014-357
DOE Contract Number:  
AC02-76SF00515
Resource Type:
Journal Article
Journal Name:
Nature Photonics 6: 35-40, 2012
Additional Journal Information:
Journal Name: Nature Photonics 6: 35-40, 2012
Country of Publication:
United States
Language:
English
Subject:
XFEL

Citation Formats

Barty, Anton, Caleman, Carl, Aquila, Andrew, Timneanu, Nicusor, Lomb, Lukas, White, Thomas A., Andreasson, Jakob, Arnlund, David, Bajt, Sasa, Barends, Thomas R.M., Barthelmess, Miriam, Bogan, Michael J., Bostedt, Christoph, Bozek, John D., Coffee, Ryan, Coppola, Nicola, Davidsson, Jan, DePonte, Daniel P., Doak, R.Bruce, Ekeberg, Thomas, and Elser, Veit. Self-terminating Diffraction Gates Femtosecond X-ray Nanocrystallography Measurements. United States: N. p., 2014. Web.
Barty, Anton, Caleman, Carl, Aquila, Andrew, Timneanu, Nicusor, Lomb, Lukas, White, Thomas A., Andreasson, Jakob, Arnlund, David, Bajt, Sasa, Barends, Thomas R.M., Barthelmess, Miriam, Bogan, Michael J., Bostedt, Christoph, Bozek, John D., Coffee, Ryan, Coppola, Nicola, Davidsson, Jan, DePonte, Daniel P., Doak, R.Bruce, Ekeberg, Thomas, & Elser, Veit. Self-terminating Diffraction Gates Femtosecond X-ray Nanocrystallography Measurements. United States.
Barty, Anton, Caleman, Carl, Aquila, Andrew, Timneanu, Nicusor, Lomb, Lukas, White, Thomas A., Andreasson, Jakob, Arnlund, David, Bajt, Sasa, Barends, Thomas R.M., Barthelmess, Miriam, Bogan, Michael J., Bostedt, Christoph, Bozek, John D., Coffee, Ryan, Coppola, Nicola, Davidsson, Jan, DePonte, Daniel P., Doak, R.Bruce, Ekeberg, Thomas, and Elser, Veit. Sat . "Self-terminating Diffraction Gates Femtosecond X-ray Nanocrystallography Measurements". United States.
@article{osti_1157046,
title = {Self-terminating Diffraction Gates Femtosecond X-ray Nanocrystallography Measurements},
author = {Barty, Anton and Caleman, Carl and Aquila, Andrew and Timneanu, Nicusor and Lomb, Lukas and White, Thomas A. and Andreasson, Jakob and Arnlund, David and Bajt, Sasa and Barends, Thomas R.M. and Barthelmess, Miriam and Bogan, Michael J. and Bostedt, Christoph and Bozek, John D. and Coffee, Ryan and Coppola, Nicola and Davidsson, Jan and DePonte, Daniel P. and Doak, R.Bruce and Ekeberg, Thomas and Elser, Veit},
abstractNote = {},
doi = {},
journal = {Nature Photonics 6: 35-40, 2012},
number = ,
volume = ,
place = {United States},
year = {2014},
month = {9}
}