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Title: Microfabricated high-bandpass foucault aperture for electron microscopy

Patent ·
OSTI ID:1150829

A variant of the Foucault (knife-edge) aperture is disclosed that is designed to provide single-sideband (SSB) contrast at low spatial frequencies but retain conventional double-sideband (DSB) contrast at high spatial frequencies in transmission electron microscopy. The aperture includes a plate with an inner open area, a support extending from the plate at an edge of the open area, a half-circle feature mounted on the support and located at the center of the aperture open area. The radius of the half-circle portion of reciprocal space that is blocked by the aperture can be varied to suit the needs of electron microscopy investigation. The aperture is fabricated from conductive material which is preferably non-oxidizing, such as gold, for example.

Research Organization:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
A02-05CH11231
Assignee:
The Regents of the University of California (Oakland, CA)
Patent Number(s):
8,816,297
Application Number:
13/708,521
OSTI ID:
1150829
Country of Publication:
United States
Language:
English

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Minimizing electrostatic charging of an aperture used to produce in-focus phase contrast in the TEM journal December 2013

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