Non-Destructive IC Defect Localization Using Optical Beam-Based Imaging.
Abstract
Abstract not provided.
- Authors:
- Publication Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1145468
- Report Number(s):
- SAND2008-2484C
518514
- DOE Contract Number:
- AC04-94AL85000
- Resource Type:
- Conference
- Resource Relation:
- Conference: Proposed for presentation at the Custom Integrated Circuits Conference held September 21-24, 2008 in San Jose, CA.
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Cole, Edward I.,. Non-Destructive IC Defect Localization Using Optical Beam-Based Imaging.. United States: N. p., 2008.
Web.
Cole, Edward I.,. Non-Destructive IC Defect Localization Using Optical Beam-Based Imaging.. United States.
Cole, Edward I.,. 2008.
"Non-Destructive IC Defect Localization Using Optical Beam-Based Imaging.". United States. https://www.osti.gov/servlets/purl/1145468.
@article{osti_1145468,
title = {Non-Destructive IC Defect Localization Using Optical Beam-Based Imaging.},
author = {Cole, Edward I.,},
abstractNote = {Abstract not provided.},
doi = {},
url = {https://www.osti.gov/biblio/1145468},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Apr 01 00:00:00 EDT 2008},
month = {Tue Apr 01 00:00:00 EDT 2008}
}
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