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Title: Non-Destructive IC Defect Localization Using Optical Beam-Based Imaging.

Abstract

Abstract not provided.

Authors:
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1145468
Report Number(s):
SAND2008-2484C
518514
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the Custom Integrated Circuits Conference held September 21-24, 2008 in San Jose, CA.
Country of Publication:
United States
Language:
English

Citation Formats

Cole, Edward I.,. Non-Destructive IC Defect Localization Using Optical Beam-Based Imaging.. United States: N. p., 2008. Web.
Cole, Edward I.,. Non-Destructive IC Defect Localization Using Optical Beam-Based Imaging.. United States.
Cole, Edward I.,. 2008. "Non-Destructive IC Defect Localization Using Optical Beam-Based Imaging.". United States. https://www.osti.gov/servlets/purl/1145468.
@article{osti_1145468,
title = {Non-Destructive IC Defect Localization Using Optical Beam-Based Imaging.},
author = {Cole, Edward I.,},
abstractNote = {Abstract not provided.},
doi = {},
url = {https://www.osti.gov/biblio/1145468}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Apr 01 00:00:00 EDT 2008},
month = {Tue Apr 01 00:00:00 EDT 2008}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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