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Title: Ion beam analysis of T and He in tritiated thin films.

Abstract

Abstract not provided.

Authors:
; ;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1143413
Report Number(s):
SAND2007-0921C
523967
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the Hydrogen and Helium Isotopes in Materials Conference held February 6-7, 2007 in Albuquerque, NM.
Country of Publication:
United States
Language:
English

Citation Formats

Knapp, James A., Browning, James Frederick, and Snow, Clark Sheldon. Ion beam analysis of T and He in tritiated thin films.. United States: N. p., 2007. Web.
Knapp, James A., Browning, James Frederick, & Snow, Clark Sheldon. Ion beam analysis of T and He in tritiated thin films.. United States.
Knapp, James A., Browning, James Frederick, and Snow, Clark Sheldon. Thu . "Ion beam analysis of T and He in tritiated thin films.". United States. doi:. https://www.osti.gov/servlets/purl/1143413.
@article{osti_1143413,
title = {Ion beam analysis of T and He in tritiated thin films.},
author = {Knapp, James A. and Browning, James Frederick and Snow, Clark Sheldon},
abstractNote = {Abstract not provided.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Thu Feb 01 00:00:00 EST 2007},
month = {Thu Feb 01 00:00:00 EST 2007}
}

Conference:
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