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Title: Real space mapping of oxygen vacancy diffusion and electrochemical transformations by hysteretic current reversal curve measurements

Patent ·
OSTI ID:1133818

An excitation voltage biases an ionic conducting material sample over a nanoscale grid. The bias sweeps a modulated voltage with increasing maximal amplitudes. A current response is measured at grid locations. Current response reversal curves are mapped over maximal amplitudes of the bias cycles. Reversal curves are averaged over the grid for each bias cycle and mapped over maximal bias amplitudes for each bias cycle. Average reversal curve areas are mapped over maximal amplitudes of the bias cycles. Thresholds are determined for onset and ending of electrochemical activity. A predetermined number of bias sweeps may vary in frequency where each sweep has a constant number of cycles and reversal response curves may indicate ionic diffusion kinetics.

Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-00OR22725
Assignee:
UT-Battelle, LLC (Oak Ridge, TN)
Patent Number(s):
8,752,211
Application Number:
13/566,327
OSTI ID:
1133818
Country of Publication:
United States
Language:
English

References (21)

Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light patent February 1994
Parametric resonance in microelectromechanical structures patent December 2002
Ba-Sr-Co-Fe-O based perovskite mixed conducting materials as cathode materials for solid oxide fuel cells patent July 2009
Scanning probe microscope and scanning method patent-application March 2005
Atomic force microscope and method for determining properties of a sample surface using an atomic force microscope patent-application April 2005
Scanning probe microscopy apparatus and techniques patent-application December 2005
Topography and recognition imaging atomic force microscope and method of operation patent-application January 2006
Drive head and personal atomic force microscope having the same patent-application June 2006
Electric potential difference detection method and scanning probe microscope patent-application March 2008
Method for Determining a Dopant Concentration in a Semiconductor Sample patent-application April 2009
Chemical Sensor with Oscillating Cantilevered Probe patent-application September 2009
Atomic Force Microscope patent-application January 2010
Near Field Scanning Measurement-Alternating Current Scanning Electrochemical Microscopy Devices and Methods of Use Thereof patent-application May 2010
Dynamic Mode Nan-Scale Imaging and Position Control Using Deflection Signal Direct Sampling of Higher Mode-Actuated Microcantilevers patent-application December 2011
Micromagnetic modeling of first-order reversal curve (FORC) diagrams for single-domain and pseudo-single-domain magnetite journal August 2003
Mapping Irreversible Electrochemical Processes on the Nanoscale: Ionic Phenomena in Li Ion Conductive Glass Ceramics journal October 2011
Mechanisms, Kinetics, and Dynamics of Oxidation and Reactions on Oxide Surfaces Investigated by Scanning Probe Microscopy journal April 2010
Atomic force microscopy as a tool for atom manipulation journal December 2009
Electrically Driven Redox Process in Cerium Oxides journal March 2010
Direct observation of oxygen atoms in rutile titanium dioxide by spherical aberration corrected high-resolution transmission electron microscopy journal July 2006
Direct Atom-Resolved Imaging of Oxides and Their Grain Boundaries journal October 2003