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Real space mapping of oxygen vacancy diffusion and electrochemical transformations by hysteretic current reversal curve measurements

Patent ·
OSTI ID:1133818
; ; ; ; ; ;
An excitation voltage biases an ionic conducting material sample over a nanoscale grid. The bias sweeps a modulated voltage with increasing maximal amplitudes. A current response is measured at grid locations. Current response reversal curves are mapped over maximal amplitudes of the bias cycles. Reversal curves are averaged over the grid for each bias cycle and mapped over maximal bias amplitudes for each bias cycle. Average reversal curve areas are mapped over maximal amplitudes of the bias cycles. Thresholds are determined for onset and ending of electrochemical activity. A predetermined number of bias sweeps may vary in frequency where each sweep has a constant number of cycles and reversal response curves may indicate ionic diffusion kinetics.
Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-00OR22725
Assignee:
UT-Battelle, LLC (Oak Ridge, TN)
Patent Number(s):
8,752,211
Application Number:
13/566,327
OSTI ID:
1133818
Country of Publication:
United States
Language:
English

References (7)

Electrically Driven Redox Process in Cerium Oxides journal March 2010
Micromagnetic modeling of first-order reversal curve (FORC) diagrams for single-domain and pseudo-single-domain magnetite journal August 2003
Mechanisms, Kinetics, and Dynamics of Oxidation and Reactions on Oxide Surfaces Investigated by Scanning Probe Microscopy journal April 2010
Direct Atom-Resolved Imaging of Oxides and Their Grain Boundaries journal October 2003
Mapping Irreversible Electrochemical Processes on the Nanoscale: Ionic Phenomena in Li Ion Conductive Glass Ceramics journal October 2011
Atomic force microscopy as a tool for atom manipulation journal December 2009
Direct observation of oxygen atoms in rutile titanium dioxide by spherical aberration corrected high-resolution transmission electron microscopy journal July 2006

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