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Title: Defects in paramagnetic Co-doped ZnO films studied by transmission electron microscopy

Abstract

We have studied planar defects in epitaxial Co:ZnO dilute magnetic semiconductor thin films deposited on c-plane sapphire (Al2O3) and the Co:ZnO/Al2O3 interface structure at atomic resolution using aberration-corrected transmission electron microscopy (TEM) and electron energy-loss spectroscopy (EELS). Comparing Co:ZnO samples deposited by pulsed laser deposition and reactive magnetron sputtering, both exhibit extrinsic stacking faults, incoherent interface structures, and compositional variations within the first 3-4 Co:ZnO layers at the interface.. In addition, we have measured the local strain which reveals the lattice distortion around the stacking faults.

Authors:
; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Pacific Northwest National Laboratory (PNNL), Richland, WA (US), Environmental Molecular Sciences Laboratory (EMSL)
Sponsoring Org.:
USDOE
OSTI Identifier:
1132710
Report Number(s):
PNNL-SA-96828
47718; KC0203020
DOE Contract Number:  
AC05-76RL01830
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics, 114(24):243503
Country of Publication:
United States
Language:
English
Subject:
Environmental Molecular Sciences Laboratory

Citation Formats

Kovacs, Andras, Ney, A., Duchamp, Martial, Ney, V., Boothroyd, Chris, Galindo, Pedro L., Kaspar, Tiffany C., Chambers, Scott A., and Dunin-Borkowski, Rafal. Defects in paramagnetic Co-doped ZnO films studied by transmission electron microscopy. United States: N. p., 2013. Web. doi:10.1063/1.4851015.
Kovacs, Andras, Ney, A., Duchamp, Martial, Ney, V., Boothroyd, Chris, Galindo, Pedro L., Kaspar, Tiffany C., Chambers, Scott A., & Dunin-Borkowski, Rafal. Defects in paramagnetic Co-doped ZnO films studied by transmission electron microscopy. United States. doi:10.1063/1.4851015.
Kovacs, Andras, Ney, A., Duchamp, Martial, Ney, V., Boothroyd, Chris, Galindo, Pedro L., Kaspar, Tiffany C., Chambers, Scott A., and Dunin-Borkowski, Rafal. Mon . "Defects in paramagnetic Co-doped ZnO films studied by transmission electron microscopy". United States. doi:10.1063/1.4851015.
@article{osti_1132710,
title = {Defects in paramagnetic Co-doped ZnO films studied by transmission electron microscopy},
author = {Kovacs, Andras and Ney, A. and Duchamp, Martial and Ney, V. and Boothroyd, Chris and Galindo, Pedro L. and Kaspar, Tiffany C. and Chambers, Scott A. and Dunin-Borkowski, Rafal},
abstractNote = {We have studied planar defects in epitaxial Co:ZnO dilute magnetic semiconductor thin films deposited on c-plane sapphire (Al2O3) and the Co:ZnO/Al2O3 interface structure at atomic resolution using aberration-corrected transmission electron microscopy (TEM) and electron energy-loss spectroscopy (EELS). Comparing Co:ZnO samples deposited by pulsed laser deposition and reactive magnetron sputtering, both exhibit extrinsic stacking faults, incoherent interface structures, and compositional variations within the first 3-4 Co:ZnO layers at the interface.. In addition, we have measured the local strain which reveals the lattice distortion around the stacking faults.},
doi = {10.1063/1.4851015},
journal = {Journal of Applied Physics, 114(24):243503},
number = ,
volume = ,
place = {United States},
year = {Mon Dec 23 00:00:00 EST 2013},
month = {Mon Dec 23 00:00:00 EST 2013}
}