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Two-axis sagittal focusing monochromator

Patent ·
OSTI ID:1130971

An x-ray focusing device and method for adjustably focusing x-rays in two orthogonal directions simultaneously. The device and method can be operated remotely using two pairs of orthogonal benders mounted on a rigid, open frame such that x-rays may pass through the opening in the frame. The added x-ray flux allows significantly higher brightness from the same x-ray source.

Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC02-98CH10886
Assignee:
Brookhaven Science Associates, LLC (Upton, NY)
Patent Number(s):
8,724,776
Application Number:
13/227,517
OSTI ID:
1130971
Country of Publication:
United States
Language:
English

References (3)

Sagittal focusing of high-energy synchrotron X-rays with asymmetric Laue crystals. II. Experimental studies journal September 2001
Sagittal focusing of high-energy synchrotron X-rays with asymmetric Laue crystals. I. Theoretical considerations journal July 2001
Spatially resolved Poisson strain and anticlastic curvature measurements in Si under large deflection bending journal June 2003

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