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Title: Two-axis sagittal focusing monochromator

Abstract

An x-ray focusing device and method for adjustably focusing x-rays in two orthogonal directions simultaneously. The device and method can be operated remotely using two pairs of orthogonal benders mounted on a rigid, open frame such that x-rays may pass through the opening in the frame. The added x-ray flux allows significantly higher brightness from the same x-ray source.

Inventors:
; ;
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1130971
Patent Number(s):
8,724,776
Application Number:
13/227,517
Assignee:
Brookhaven Science Associates, LLC (Upton, NY)
DOE Contract Number:  
AC02-98CH10886
Resource Type:
Patent
Resource Relation:
Patent File Date: 2011 Sep 08
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Haas, Edwin G, Stelmach, Christopher, and Zhong, Zhong. Two-axis sagittal focusing monochromator. United States: N. p., 2014. Web.
Haas, Edwin G, Stelmach, Christopher, & Zhong, Zhong. Two-axis sagittal focusing monochromator. United States.
Haas, Edwin G, Stelmach, Christopher, and Zhong, Zhong. Tue . "Two-axis sagittal focusing monochromator". United States. https://www.osti.gov/servlets/purl/1130971.
@article{osti_1130971,
title = {Two-axis sagittal focusing monochromator},
author = {Haas, Edwin G and Stelmach, Christopher and Zhong, Zhong},
abstractNote = {An x-ray focusing device and method for adjustably focusing x-rays in two orthogonal directions simultaneously. The device and method can be operated remotely using two pairs of orthogonal benders mounted on a rigid, open frame such that x-rays may pass through the opening in the frame. The added x-ray flux allows significantly higher brightness from the same x-ray source.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2014},
month = {5}
}

Patent:

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Works referenced in this record:

Spatially resolved Poisson strain and anticlastic curvature measurements in Si under large deflection bending
journal, June 2003

  • Yang, Wenge; Larson, B. C.; Ice, G. E.
  • Applied Physics Letters, Vol. 82, Issue 22
  • DOI: 10.1063/1.1579857

Sagittal focusing of high-energy synchrotron X-rays with asymmetric Laue crystals. II. Experimental studies
journal, September 2001

  • Zhong, Z.; Kao, C. C.; Siddons, D. P.
  • Journal of Applied Crystallography, Vol. 34, Issue 5, p. 646-653
  • DOI: 10.1107/S0021889801010627

Sagittal focusing of high-energy synchrotron X-rays with asymmetric Laue crystals. I. Theoretical considerations
journal, July 2001

  • Zhong, Z.; Kao, C. C.; Siddons, D. P.
  • Journal of Applied Crystallography, Vol. 34, Issue 4, p. 504-509
  • DOI: 10.1107/S0021889801006409