Sub-microsecond-resolution probe microscopy

Ginger, David; Giridharagopal, Rajiv; Moore, David; Rayermann, Glennis; Reid, Obadiah

Title: Sub-microsecond-resolution probe microscopy

Patent · Tue Apr 01 00:00:00 EDT 2014

OSTI ID:1128706

Ginger, David; Giridharagopal, Rajiv; Moore, David; Rayermann, Glennis; Reid, Obadiah

Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.

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Research Organization:: University of Washington, Seattle, WA (United States). Center for Commercialization

Sponsoring Organization:: USDOE

DOE Contract Number:: SC0001084

Assignee:: University of Washington through its Center for Commercialization (Seattle, WA)

Patent Number(s):: 8,686,358

Application Number:: 13/232,859

OSTI ID:: 1128706

Resource Relation:: Patent File Date: 2011 Sep 14

Country of Publication:: United States

Language:: English

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