Hyperspectral stimulated emission depletion microscopy and methods of use thereof
Patent
·
OSTI ID:1128705
A hyperspectral stimulated emission depletion ("STED") microscope system for high-resolution imaging of samples labeled with multiple fluorophores (e.g., two to ten fluorophores). The hyperspectral STED microscope includes a light source, optical systems configured for generating an excitation light beam and a depletion light beam, optical systems configured for focusing the excitation and depletion light beams on a sample, and systems for collecting and processing data generated by interaction of the excitation and depletion light beams with the sample. Hyperspectral STED data may be analyzed using multivariate curve resolution analysis techniques to deconvolute emission from the multiple fluorophores. The hyperspectral STED microscope described herein can be used for multi-color, subdiffraction imaging of samples (e.g., materials and biological materials) and for analyzing a tissue by Forster Resonance Energy Transfer ("FRET").
- Research Organization:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC04-94AL85000;
- Assignee:
- Sandia Corporation (Albuquerque, NM)
- Patent Number(s):
- 8,686,363
- Application Number:
- 13/609,057
- OSTI ID:
- 1128705
- Country of Publication:
- United States
- Language:
- English
Similar Records
Multi-images deconvolution improves signal-to-noise ratio on gated stimulated emission depletion microscopy
Supercontinuum Stimulated Emission Depletion Fluorescence Lifetime Imaging
Diffraction barrier breakthrough in coherent anti-Stokes Raman scattering microscopy by additional probe-beam-induced phonon depletion
Journal Article
·
2014
· Applied Physics Letters
·
OSTI ID:22395785
Supercontinuum Stimulated Emission Depletion Fluorescence Lifetime Imaging
Journal Article
·
2012
· Journal of Physical Chemistry B
·
OSTI ID:1044798
Diffraction barrier breakthrough in coherent anti-Stokes Raman scattering microscopy by additional probe-beam-induced phonon depletion
Journal Article
·
2011
· Physical Review. A
·
OSTI ID:21537240