LAr TPC Electronics CMOS Lifetime at 300 K and 77 K and Reliability Under Thermal Cycling
Journal Article
·
· IEEE Transactions on Nuclear Science
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE SC OFFICE OF SCIENCE (SC)
- DOE Contract Number:
- DE-AC02-98CH10886
- OSTI ID:
- 1123658
- Report Number(s):
- BNL-103771-2014-JA; KA-04
- Journal Information:
- IEEE Transactions on Nuclear Science, Vol. 60
- Country of Publication:
- United States
- Language:
- English
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