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Title: Measuring Thermal Conductivity with Raman:Capability Uncertainty and Strain Effects.

Abstract

Abstract not provided.

Authors:
;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1116156
Report Number(s):
SAND2012-10198C
480178
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the IMECE 2012 held November 11-15, 2012 in Houston, TX.
Country of Publication:
United States
Language:
English

Citation Formats

Beechem Iii, Thomas Edwin, and Yates, Luke. Measuring Thermal Conductivity with Raman:Capability Uncertainty and Strain Effects.. United States: N. p., 2012. Web.
Beechem Iii, Thomas Edwin, & Yates, Luke. Measuring Thermal Conductivity with Raman:Capability Uncertainty and Strain Effects.. United States.
Beechem Iii, Thomas Edwin, and Yates, Luke. Thu . "Measuring Thermal Conductivity with Raman:Capability Uncertainty and Strain Effects.". United States. https://www.osti.gov/servlets/purl/1116156.
@article{osti_1116156,
title = {Measuring Thermal Conductivity with Raman:Capability Uncertainty and Strain Effects.},
author = {Beechem Iii, Thomas Edwin and Yates, Luke},
abstractNote = {Abstract not provided.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2012},
month = {11}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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