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Title: Continuously variable focal length lens

Abstract

A material preferably in crystal form having a low atomic number such as beryllium (Z=4) provides for the focusing of x-rays in a continuously variable manner. The material is provided with plural spaced curvilinear, optically matched slots and/or recesses through which an x-ray beam is directed. The focal length of the material may be decreased or increased by increasing or decreasing, respectively, the number of slots (or recesses) through which the x-ray beam is directed, while fine tuning of the focal length is accomplished by rotation of the material so as to change the path length of the x-ray beam through the aligned cylindrical slows. X-ray analysis of a fixed point in a solid material may be performed by scanning the energy of the x-ray beam while rotating the material to maintain the beam's focal point at a fixed point in the specimen undergoing analysis.

Inventors:
;
Publication Date:
Research Org.:
ANL (Argonne National Laboratory (ANL), Argonne, IL (United States))
Sponsoring Org.:
USDOE
OSTI Identifier:
1110779
Patent Number(s):
8,611,502
Application Number:
12/910,013
Assignee:
U.S. Department of Energy (Washington, DC) ANL
DOE Contract Number:  
ACO2-06CH11357
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Adams, Bernhard W, and Chollet, Matthieu C. Continuously variable focal length lens. United States: N. p., 2013. Web.
Adams, Bernhard W, & Chollet, Matthieu C. Continuously variable focal length lens. United States.
Adams, Bernhard W, and Chollet, Matthieu C. Tue . "Continuously variable focal length lens". United States. https://www.osti.gov/servlets/purl/1110779.
@article{osti_1110779,
title = {Continuously variable focal length lens},
author = {Adams, Bernhard W and Chollet, Matthieu C},
abstractNote = {A material preferably in crystal form having a low atomic number such as beryllium (Z=4) provides for the focusing of x-rays in a continuously variable manner. The material is provided with plural spaced curvilinear, optically matched slots and/or recesses through which an x-ray beam is directed. The focal length of the material may be decreased or increased by increasing or decreasing, respectively, the number of slots (or recesses) through which the x-ray beam is directed, while fine tuning of the focal length is accomplished by rotation of the material so as to change the path length of the x-ray beam through the aligned cylindrical slows. X-ray analysis of a fixed point in a solid material may be performed by scanning the energy of the x-ray beam while rotating the material to maintain the beam's focal point at a fixed point in the specimen undergoing analysis.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2013},
month = {12}
}

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