skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Band Alignment in Ge/GeOx/HfO2/TiO2 Heterojunctions as Measured by Hard x-ray Photoelectron Spectroscopy

Authors:
; ; ; ; ; ;
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL)
Sponsoring Org.:
USDOE SC OFFICE OF SCIENCE (SC)
OSTI Identifier:
1109601
Report Number(s):
BNL-102735-2013-JA
Journal ID: ISSN 0003-6951
DOE Contract Number:  
DE-AC02-98CH10886
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 101; Journal Issue: 22; Journal ID: ISSN 0003-6951
Country of Publication:
United States
Language:
English

Citation Formats

A Rumaiz, J Woicik, C Weiland, Q Xie, D Siddons, G Jaffari, and C Detavernier. Band Alignment in Ge/GeOx/HfO2/TiO2 Heterojunctions as Measured by Hard x-ray Photoelectron Spectroscopy. United States: N. p., 2012. Web. doi:10.1063/1.4768947.
A Rumaiz, J Woicik, C Weiland, Q Xie, D Siddons, G Jaffari, & C Detavernier. Band Alignment in Ge/GeOx/HfO2/TiO2 Heterojunctions as Measured by Hard x-ray Photoelectron Spectroscopy. United States. doi:10.1063/1.4768947.
A Rumaiz, J Woicik, C Weiland, Q Xie, D Siddons, G Jaffari, and C Detavernier. Thu . "Band Alignment in Ge/GeOx/HfO2/TiO2 Heterojunctions as Measured by Hard x-ray Photoelectron Spectroscopy". United States. doi:10.1063/1.4768947.
@article{osti_1109601,
title = {Band Alignment in Ge/GeOx/HfO2/TiO2 Heterojunctions as Measured by Hard x-ray Photoelectron Spectroscopy},
author = {A Rumaiz and J Woicik and C Weiland and Q Xie and D Siddons and G Jaffari and C Detavernier},
abstractNote = {},
doi = {10.1063/1.4768947},
journal = {Applied Physics Letters},
issn = {0003-6951},
number = 22,
volume = 101,
place = {United States},
year = {2012},
month = {11}
}