Surface characterization of CuInS{sub 2} with lamellar morphology
- CNR, Padova (Italy). Ist. di Polargrafia ed Elettrochimica Preparativa
- Dipt. di Chimica Inorganica Metallorganica ed Analitica, Padova (Italy)
- North Carolina State Univ., Raleigh, NC (United States). Dept. of Materials Science and Engineering
Lamellar crystals of CuInS{sub 2} grown in a steep temperature gradient have been characterized. Dispersive X-ray analyses show a predominant stoichiometry Cu/In/S = 1/1/2 and inclusions of Cu deficient phases. The cleaved surface is smooth, but after chemical etching a fine structure appears, with a great number of closely packed microcrystals of a dendritic shape. X-ray diffraction spectra of lamellae only show the reflections of the CuInS{sub 2} (112) and of the CuIn{sub 5}S{sub 8} (111) lattice planes, indicating a strongly oriented structure. Depth profiles of CuInS{sub 2} lamellae investigated with X-ray photoelectron spectroscopy show the presence at the cleaved surface of Cu deficient phases like CuIn{sub 5}S{sub 8}, which are a few tens of nanometers thick. The lamellar growth mechanism is discussed on the basis of these findings. X-ray photoelectron spectroscopy and secondary ion mass spectrometry investigations show that the oxidation behavior of the lamellar material resembles that of traditional CuInX{sub 2} phases (X = S, Se).
- Sponsoring Organization:
- USDOE
- OSTI ID:
- 110136
- Journal Information:
- Journal of the Electrochemical Society, Vol. 142, Issue 8; Other Information: PBD: Aug 1995
- Country of Publication:
- United States
- Language:
- English
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