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Title: Thermally Annealed Iron (Oxide) Thin Film on an Alumina Barrier Layer, by XPS

Abstract

Herein we show characterization of an Fe thin film on Al_2O_3 after thermal annealing under H_2 using Al Ka X-rays. The XPS survey spectrum, narrow Fe 2p scan, and valence band regions are presented. The survey spectrum shows aluminum signals due to exposure of the underlying Al_2O_3 film during Fe nanoparticle formation.

Authors:
; ; ; ; ; ;
Publication Date:
Research Org.:
Pacific Northwest National Laboratory (PNNL), Richland, WA (US), Environmental Molecular Sciences Laboratory (EMSL)
Sponsoring Org.:
USDOE
OSTI Identifier:
1094925
Report Number(s):
PNNL-SA-95255
34739; KP1704020
DOE Contract Number:
AC05-76RL01830
Resource Type:
Journal Article
Resource Relation:
Journal Name: Surface Science Spectra, 20(1):Article No. 55
Country of Publication:
United States
Language:
English
Subject:
Environmental Molecular Sciences Laboratory

Citation Formats

Madaan, Nitesh, Kanyal, Supriya S., Jensen, David S., Vail, Michael A., Dadson, Andrew, Engelhard, Mark H., and Linford, Matthew R.. Thermally Annealed Iron (Oxide) Thin Film on an Alumina Barrier Layer, by XPS. United States: N. p., 2013. Web. doi:10.1116/11.20121105.
Madaan, Nitesh, Kanyal, Supriya S., Jensen, David S., Vail, Michael A., Dadson, Andrew, Engelhard, Mark H., & Linford, Matthew R.. Thermally Annealed Iron (Oxide) Thin Film on an Alumina Barrier Layer, by XPS. United States. doi:10.1116/11.20121105.
Madaan, Nitesh, Kanyal, Supriya S., Jensen, David S., Vail, Michael A., Dadson, Andrew, Engelhard, Mark H., and Linford, Matthew R.. Fri . "Thermally Annealed Iron (Oxide) Thin Film on an Alumina Barrier Layer, by XPS". United States. doi:10.1116/11.20121105.
@article{osti_1094925,
title = {Thermally Annealed Iron (Oxide) Thin Film on an Alumina Barrier Layer, by XPS},
author = {Madaan, Nitesh and Kanyal, Supriya S. and Jensen, David S. and Vail, Michael A. and Dadson, Andrew and Engelhard, Mark H. and Linford, Matthew R.},
abstractNote = {Herein we show characterization of an Fe thin film on Al_2O_3 after thermal annealing under H_2 using Al Ka X-rays. The XPS survey spectrum, narrow Fe 2p scan, and valence band regions are presented. The survey spectrum shows aluminum signals due to exposure of the underlying Al_2O_3 film during Fe nanoparticle formation.},
doi = {10.1116/11.20121105},
journal = {Surface Science Spectra, 20(1):Article No. 55},
number = ,
volume = ,
place = {United States},
year = {Fri Sep 06 00:00:00 EDT 2013},
month = {Fri Sep 06 00:00:00 EDT 2013}
}
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