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Title: Advance in a nano- accuracy surface profiler with an extended-angle test range

Authors:
; ;
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL)
Sponsoring Org.:
USDOE SC OFFICE OF SCIENCE (SC)
OSTI Identifier:
1091769
Report Number(s):
BNL-101103-2013-JA
R&D Project: LS001
DOE Contract Number:  
DE-AC02-98CH10886
Resource Type:
Journal Article
Journal Name:
Nuclear Instuments and Methods in Physics Research Section A-Accerlerators Spectrometers Detectors and Associated Equipment
Additional Journal Information:
Journal Volume: 710
Country of Publication:
United States
Language:
English
Subject:
36

Citation Formats

Qian S., Qian K., and Idir,M. Advance in a nano- accuracy surface profiler with an extended-angle test range. United States: N. p., 2012. Web.
Qian S., Qian K., & Idir,M. Advance in a nano- accuracy surface profiler with an extended-angle test range. United States.
Qian S., Qian K., and Idir,M. Sat . "Advance in a nano- accuracy surface profiler with an extended-angle test range". United States.
@article{osti_1091769,
title = {Advance in a nano- accuracy surface profiler with an extended-angle test range},
author = {Qian S. and Qian K. and Idir,M.},
abstractNote = {},
doi = {},
journal = {Nuclear Instuments and Methods in Physics Research Section A-Accerlerators Spectrometers Detectors and Associated Equipment},
number = ,
volume = 710,
place = {United States},
year = {2012},
month = {11}
}