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Title: Probing Local Ionic Dynamics in Functional Oxides at the Nanoscale

Abstract

A scanning probe microscopy (SPM) based technique for probing local ionic dynamics in electrochemically-active materials based on the first-order reversal curve current-voltage (FORC-IV) method is presented. FORC-IV imaging mode is applied to a Ca-substituted bismuth ferrite (Ca-BFO) system to separate the electronic and ionic phenomena in this material and visualize the spatial variability of these behaviors. The variable-temperature measurements further demonstrate the interplay between the thermally and electric-field-driven resistance changes in Ca-BFO. The FORC-IV is shown to be a simple, powerful and flexible method for studying electrochemical activity of materials at the nanoscale and, in conjunction with the Electrochemical Strain Microscopy, for differentiating ferroelectric and ionic behaviors.

Authors:
 [1];  [1];  [1];  [1];  [1];  [2];  [2];  [2];  [1]
  1. ORNL
  2. National Chiao Tung University, Hsinchu, Taiwan
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1090492
DOE Contract Number:  
DE-AC05-00OR22725
Resource Type:
Journal Article
Journal Name:
Nano Letters
Additional Journal Information:
Journal Volume: 13; Journal Issue: 8; Journal ID: ISSN 1530--6984
Country of Publication:
United States
Language:
English
Subject:
SPM; ionic dynamics; Ca-BFO; voltage spectroscopy; oxygen vacancy

Citation Formats

Strelcov, Evgheni, Kim, Yunseok, Jesse, Stephen, Ivanov, Ilia N, Kravchenko, Ivan I, Wang, Chih-Hung, Teng, Yung-Chun, Chu, Ying Hao, and Kalinin, Sergei V. Probing Local Ionic Dynamics in Functional Oxides at the Nanoscale. United States: N. p., 2013. Web. doi:10.1021/nl400780d.
Strelcov, Evgheni, Kim, Yunseok, Jesse, Stephen, Ivanov, Ilia N, Kravchenko, Ivan I, Wang, Chih-Hung, Teng, Yung-Chun, Chu, Ying Hao, & Kalinin, Sergei V. Probing Local Ionic Dynamics in Functional Oxides at the Nanoscale. United States. https://doi.org/10.1021/nl400780d
Strelcov, Evgheni, Kim, Yunseok, Jesse, Stephen, Ivanov, Ilia N, Kravchenko, Ivan I, Wang, Chih-Hung, Teng, Yung-Chun, Chu, Ying Hao, and Kalinin, Sergei V. 2013. "Probing Local Ionic Dynamics in Functional Oxides at the Nanoscale". United States. https://doi.org/10.1021/nl400780d.
@article{osti_1090492,
title = {Probing Local Ionic Dynamics in Functional Oxides at the Nanoscale},
author = {Strelcov, Evgheni and Kim, Yunseok and Jesse, Stephen and Ivanov, Ilia N and Kravchenko, Ivan I and Wang, Chih-Hung and Teng, Yung-Chun and Chu, Ying Hao and Kalinin, Sergei V},
abstractNote = {A scanning probe microscopy (SPM) based technique for probing local ionic dynamics in electrochemically-active materials based on the first-order reversal curve current-voltage (FORC-IV) method is presented. FORC-IV imaging mode is applied to a Ca-substituted bismuth ferrite (Ca-BFO) system to separate the electronic and ionic phenomena in this material and visualize the spatial variability of these behaviors. The variable-temperature measurements further demonstrate the interplay between the thermally and electric-field-driven resistance changes in Ca-BFO. The FORC-IV is shown to be a simple, powerful and flexible method for studying electrochemical activity of materials at the nanoscale and, in conjunction with the Electrochemical Strain Microscopy, for differentiating ferroelectric and ionic behaviors.},
doi = {10.1021/nl400780d},
url = {https://www.osti.gov/biblio/1090492}, journal = {Nano Letters},
issn = {1530--6984},
number = 8,
volume = 13,
place = {United States},
year = {Tue Jan 01 00:00:00 EST 2013},
month = {Tue Jan 01 00:00:00 EST 2013}
}