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Title: Pulse mode readout techniques for use with non-gridded industrial ionization chambers

Conference ·

Highly sensitive readout technique for precision long-term radiation measurements has been developed and tested in the Radiation Control Department at Jefferson Lab. The new electronics design is used to retrieve ionization data in a pulse mode. The dedicated data acquisition system works with M=Audio Audiophile 192 High-Definition 24-bit/192 kHz audio cards, taking data in continuous waveform recording mode. The on-line data processing algorithms extract signals of the ionization events from the data flow and measure the ionization value for each event. Two different ion chambers are evaluated. The first is a Reuter-Stokes Argon-filled (at 25 atm) High Pressure Ionization Chamber (HPIC), commonly used as a detector part in many GE Reuter-Stokes instruments of the RSS series. The second is a VacuTec Model 70181, 5 atm Xenon-filled ionization chamber. Results for both chambers indicate that the techniques allow using industrial ICs for high sensitivity and precision long-term radiation measurements, while at the same time providing information about spectral characteristics of the radiation fields.

Research Organization:
Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
DOE Contract Number:
AC05-06OR23177
OSTI ID:
1089949
Report Number(s):
JLAB-EHSQ-11-02; DOE/OR/23177-2693
Resource Relation:
Conference: 2011 Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC),23-29 Oct. 2011
Country of Publication:
United States
Language:
English