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Title: Reaction Between Thin Gold Wires And Pb-Sn-In Solder (37.5%, 37.5%, 25%), Part C. A Comprehensive Model Of The Reaction Inside The Solder Mounds In Both The Interface Controlled Regime And The Diffusion-Controlled Regime.

Authors:
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1084719
Report Number(s):
LLNL-TR-637972
DOE Contract Number:
W-7405-ENG-48
Resource Type:
Technical Report
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Siekhaus, W J. Reaction Between Thin Gold Wires And Pb-Sn-In Solder (37.5%, 37.5%, 25%), Part C. A Comprehensive Model Of The Reaction Inside The Solder Mounds In Both The Interface Controlled Regime And The Diffusion-Controlled Regime.. United States: N. p., 2012. Web. doi:10.2172/1084719.
Siekhaus, W J. Reaction Between Thin Gold Wires And Pb-Sn-In Solder (37.5%, 37.5%, 25%), Part C. A Comprehensive Model Of The Reaction Inside The Solder Mounds In Both The Interface Controlled Regime And The Diffusion-Controlled Regime.. United States. doi:10.2172/1084719.
Siekhaus, W J. Tue . "Reaction Between Thin Gold Wires And Pb-Sn-In Solder (37.5%, 37.5%, 25%), Part C. A Comprehensive Model Of The Reaction Inside The Solder Mounds In Both The Interface Controlled Regime And The Diffusion-Controlled Regime.". United States. doi:10.2172/1084719. https://www.osti.gov/servlets/purl/1084719.
@article{osti_1084719,
title = {Reaction Between Thin Gold Wires And Pb-Sn-In Solder (37.5%, 37.5%, 25%), Part C. A Comprehensive Model Of The Reaction Inside The Solder Mounds In Both The Interface Controlled Regime And The Diffusion-Controlled Regime.},
author = {Siekhaus, W J},
abstractNote = {},
doi = {10.2172/1084719},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Aug 14 00:00:00 EDT 2012},
month = {Tue Aug 14 00:00:00 EDT 2012}
}

Technical Report:

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