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Title: Fundamental and methodological investigations for the improvement of elemental analysis by inductively coupled plasma mass soectrometry

Abstract

This dissertation describes a variety of studies meant to improve the analytical performance of inductively coupled plasma mass spectrometry (ICP-MS) and laser ablation (LA) ICP-MS. The emission behavior of individual droplets and LA generated particles in an ICP is studied using a high-speed, high frame rate digital camera. Phenomena are observed during the ablation of silicate glass that would cause elemental fractionation during analysis by ICP-MS. Preliminary work for ICP torch developments specifically tailored for the improvement of LA sample introduction are presented. An abnormal scarcity of metal-argon polyatomic ions (MAr{sup +}) is observed during ICP-MS analysis. Evidence shows that MAr{sup +} ions are dissociated by collisions with background gas in a shockwave near the tip of the skimmer cone. Method development towards the improvement of LA-ICP-MS for environmental monitoring is described. A method is developed to trap small particles in a collodion matrix and analyze each particle individually by LA-ICP-MS.

Authors:
 [1]
  1. Ames Lab., Ames, IA (United States)
Publication Date:
Research Org.:
Ames Laboratory (AMES), Ames, IA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1082957
Report Number(s):
IS-T 3073
DOE Contract Number:
AC02-07CH11358
Resource Type:
Thesis/Dissertation
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

Citation Formats

Ebert, Christopher Hysjulien. Fundamental and methodological investigations for the improvement of elemental analysis by inductively coupled plasma mass soectrometry. United States: N. p., 2012. Web. doi:10.2172/1082957.
Ebert, Christopher Hysjulien. Fundamental and methodological investigations for the improvement of elemental analysis by inductively coupled plasma mass soectrometry. United States. doi:10.2172/1082957.
Ebert, Christopher Hysjulien. Sun . "Fundamental and methodological investigations for the improvement of elemental analysis by inductively coupled plasma mass soectrometry". United States. doi:10.2172/1082957. https://www.osti.gov/servlets/purl/1082957.
@article{osti_1082957,
title = {Fundamental and methodological investigations for the improvement of elemental analysis by inductively coupled plasma mass soectrometry},
author = {Ebert, Christopher Hysjulien},
abstractNote = {This dissertation describes a variety of studies meant to improve the analytical performance of inductively coupled plasma mass spectrometry (ICP-MS) and laser ablation (LA) ICP-MS. The emission behavior of individual droplets and LA generated particles in an ICP is studied using a high-speed, high frame rate digital camera. Phenomena are observed during the ablation of silicate glass that would cause elemental fractionation during analysis by ICP-MS. Preliminary work for ICP torch developments specifically tailored for the improvement of LA sample introduction are presented. An abnormal scarcity of metal-argon polyatomic ions (MAr{sup +}) is observed during ICP-MS analysis. Evidence shows that MAr{sup +} ions are dissociated by collisions with background gas in a shockwave near the tip of the skimmer cone. Method development towards the improvement of LA-ICP-MS for environmental monitoring is described. A method is developed to trap small particles in a collodion matrix and analyze each particle individually by LA-ICP-MS.},
doi = {10.2172/1082957},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 2012},
month = {Sun Jan 01 00:00:00 EST 2012}
}

Thesis/Dissertation:
Other availability
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  • Particle size effects and elemental fractionation in laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) are investigated with nanosecond and femtosecond laser ablation, differential mobility analysis, and magnetic sector ICP-MS. Laser pulse width was found to have a significant influence on the LA particle size distribution and the elemental composition of the aerosol and thus fractionation. Emission from individual particles from solution nebulization, glass, and a pressed powder pellet are observed with high speed digital photography. The presence of intact particles in an ICP is shown to be a likely source of fractionation. A technique for the online detection ofmore » stimulated elemental release from neural tissue using magnetic sector ICP-MS is described. Detection limits of 1 μg L -1 or better were found for P, Mn, Fe, Cu, and Zn in a 60 μL injection in a physiological saline matrix.« less
  • Determining the composition of thin layers is increasingly important for a variety of industrial materials such as adhesives, coatings and microelectronics. Secondary ion mass spectrometry (SIMS), Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), glow discharge optical emission spectroscopy (GDOES), glow discharge mass spectrometry (GDMS), and laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS) are some of the techniques that are currently employed for the direct analysis of the sample surface. Although these techniques do not suffer from the contamination problems that often plague sample dissolution studies, they do require matrix matched standards for quantification. Often, these standards are not readily available.more » Despite the costs of clean hoods, Teflon pipette tips and bottles, and pure acids, partial sample dissolution is the primary method used in the semiconductor industry to quantify surface impurities. Specifically, vapor phase decomposition (VPD) coupled to ICP-MS or total reflection x-ray fluorescence (TXRF) provides elemental information from the top most surface layers at detection sensitivities in the 10 7-10 10atoms/cm 2 range. The ability to quantify with standard solutions is a main advantage of these techniques. Li and Houk applied a VPD-like technique to steel. The signal ratio of trace element to matrix element was used for quantification. Although controlled dissolution concentrations determined for some of the dissolved elements agreed with the certified values, concentrations determined for refractory elements (Ti, Nb and Ta) were too low. LA-ICP-MS and scanning electron microscopy (SEM) measurements indicated that carbide grains distributed throughout the matrix were high in these refractory elements. These elements dissolved at a slower rate than the matrix element, Fe. If the analyte element is not removed at a rate similar to the matrix element a true representation of the sample layer cannot be realized. Specifically, the ratio of analyte signal to matrix element signal does not equal the actual ratio in the bulk sample. The objective of this work was to investigate the controlled dissolution of other materials, simpler than steel. Matrices of copper, high copper alloy and NIST C1100 brass were investigated but the matrix that showed the best agreement between measured and certified values was NIST 612 glass. Further studies were conducted to limit the amount of surface layers removed for the NIST 612 matrix.« less
  • The sampling of ions from an atmospheric pressure inductively coupled plasma for mass spectrometry (ICP-MS) with a supersonic nozzle and skimmer is shown to follow similar behavior found for neutral beam studies and of ion extraction from other plasmas and flames. The dependence of count rates for metal oxide and doubly charged ions on ICP operating parameters, and sampling interface configuration are discussed for this instrument. A simple method is described for the approximate measurement of the ion energy distribution in ICP-MS. The average ion kinetic energy, kinetic energy spread, and maximum kinetic energy are evaluated from a plot ofmore » ion signal as a function of retarding voltage applied to the quadrupole mass analyzer. The effects of plasma operating parameters on ion signals and energies are described. The interference on the ionization of cobalt by five salts, NaCl, MgCl/sub 2/, NH/sub 4/I, NH/sub 4/Br and NH/sub 4/Cl, in an ICP is first considered theoretically and subsequently the theoretical trends are established experimentally by ICP-MS. The interference trends are found to be in the order of the most easily ionized element in the matrix salt, i.e., Na > Mg > I > Br > Cl.« less
  • This thesis is divided into 4 parts: elemental speciation, speciation of mercury and lead compounds by microbore column LC-ICP-MS with direct injection nebulization, spatially resolved measurements of size and velocity distributions of aerosol droplets from a direct injection nebulizer, and elemental speciation by anion exchange and size exclusion chromatography with detection by ICP-MS with direct injection nebulization.
  • The fundamental and practical aspects are described for extracting ions from atmospheric pressure plasma sources into an analytical mass spectrometer. Methodologies and basic concepts of inductively coupled plasma mass spectrometry (ICP-MS) are emphasized in the discussion, including ion source, sampling interface, supersonic expansion, slumming process, ion optics and beam focusing, and vacuum considerations. Some new developments and innovative designs are introduced. The plasma extraction process in ICP-MS was investigated by Langmuir measurements in the region between the skimmer and first ion lens. Electron temperature (T e) is in the range 2000--11000 K and changes with probe position inside an aerosolmore » gas flow. Electron density (n e) is in the range 10 8--10 10 -cm at the skimmer tip and drops abruptly to 10 6--10 8 cm -3 near the skimmer tip and drops abruptly to 10 6--10 8 cm -3 downstream further behind the skimmer. Electron density in the beam leaving the skimmer also depends on water loading and on the presence and mass of matrix elements. Axially resolved distributions of electron number-density and electron temperature were obtained to characterize the ion beam at a variety of plasma operating conditions. The electron density dropped by a factor of 101 along the centerline between the sampler and skimmer cones in the first stage and continued to drop by factors of 10 4--10 5 downstream of skimmer to the entrance of ion lens. The electron density in the beam expansion behind sampler cone exhibited a 1/z 2 intensity fall-off (z is the axial position). An second beam expansion originated from the skimmer entrance, and the beam flow underwent with another 1/z 2 fall-off behind the skimmer. Skimmer interactions play an important role in plasma extraction in the ICP-MS instrument.« less