Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Systems for increasing the sensitivity of gamma-ray imagers

Patent ·
OSTI ID:1082446
Systems that increase the position resolution and granularity of double sided segmented semiconductor detectors are provided. These systems increase the imaging resolution capability of such detectors, either used as Compton cameras, or as position sensitive radiation detectors in imagers such as SPECT, PET, coded apertures, multi-pinhole imagers, or other spatial or temporal modulated imagers.
Research Organization:
LLNL (Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States))
Sponsoring Organization:
USDOE
DOE Contract Number:
AC52-07NA27344
Assignee:
Lawrence Livermore National Security, LLC (Livermore, CA)
Patent Number(s):
8,330,114
Application Number:
13/349,520
OSTI ID:
1082446
Country of Publication:
United States
Language:
English

References (1)

SPEIR: A Ge Compton Camera report February 2004

Similar Records

Methods for increasing the sensitivity of gamma-ray imagers
Patent · 2012 · OSTI ID:1037753

Methods for increasing the efficiency of Compton imagers
Conference · 2005 · OSTI ID:888616

Pinhole SPECT: An approach to in vivo high resolution SPECT imaging in small laboratory animals
Journal Article · 1994 · Journal of Nuclear Medicine Technology · OSTI ID:135840

Related Subjects